Circuit for compensating for time variation of temperature in an inductive sensor

• US 7,061,229 B2
• Filed: 12/02/2004
• Issued: 06/13/2006
• Est. Priority Date: 07/24/2000
• Status: Expired due to Term

• Current Assignee: Lord Corporation (Parker-Hannifin Corporation)
• Original Assignee: MicroStrain, Inc. (Spectris PLC)
• Inventors: Townsend, Christopher, Arms, Steven
• Primary Examiner(s): PATIDAR, JAY M
• Application Number:
  US11/001,829
• Publication Number:
  US 20050093537A1
• Time in Patent Office: 558 Days
• Field of Search: 324/207.12, 324/207.15, 324/207.16, 324/207.19, 324/207.24, 324/225, 324/234, 324/236, 324/669, 324/670
• US Class Current: 324/207.12
• CPC Class Codes: G01D 3/036 on measuring arrangements themselves
• CPC Class Codes: G01D 5/2013 by a movable ferromagnetic element, e.g. a core G01D5/2033 takes precedence

Abstract

A sensing device includes a circuit that compensates for time and spatial changes in temperature. The circuit includes elements to correct for variation in permeability of a highly permeable core of a differential variable reluctance transducer as temperature changes. The circuit also provides correction for temperature gradients across coils of the transducer.

Claims

1. An electronic device for sensing at least one parameter, comprising:

a first circuit element comprising a reactance and a resistance, said first circuit element comprising input terminals and output terminals;

said input terminals for providing a first input signal and a second input signal different from said first signal to said first circuit element;

said output terminals for providing a first output signal and a second output signal from said first circuit element;

a second circuit element connected to said output terminals to use said first output signal and said second output signal, wherein said second circuit element generates a first parameter that depends exclusively on said resistance and a second parameter that depends exclusively on said reactance; and

a third circuit element connected to said second circuit element wherein said third circuit element compensates gain of said second parameter for changes in said first parameter.

2. An electronic device as recited in claim 1, wherein said first circuit element comprises a variable reluctance transducer having a high permeability core, wherein said first parameter provides a measure of temperature and said second parameter provides a measure of position of said core in said transducer.

3. An electronic device as recited in claim 2, wherein a portion of said variable reluctance transducer is included in a Wheatstone bridge.

4. An electronic device as recited in claim 2, wherein said a variable reluctance transducer comprises a differential variable reluctance transducer.

5. An electronic device as recited in claim 1, wherein said first circuit element includes a variable reactance, wherein said variable reactance includes a core, wherein said first parameter is used to correct said second parameter for variation in permeability of said core with temperature.

6. An electronic device as recited in claim 1, wherein said first circuit element includes a variable reactance, wherein said variable reactance includes a core, wherein said third circuit element comprises a third output signal, wherein said third output signal comprises displacement of said core corrected for temperature of said core.

7. An electronic device as recited in claim 1, wherein said third circuit element further comprises a device containing a relationship between said second parameter and said first parameter, wherein said device provides said relationship for said correction.

8. An electronic device as recited in claim 7, wherein said device comprises a variable gain amplifier.

9. An electronic device as recited in claim 8, wherein said second circuit element comprises a voltage controlled gain amplifier.

10. An electronic device as recited in claim 7, wherein said device comprises a programable device.

11. An electronic device as recited in claim 10, wherein said programable device comprises a microprocessor.

12. A circuit as recited in claim 1, wherein said first input signal has a first frequency and said second input signal has a second frequency, said first frequency lower than said second frequency, and wherein said second circuit comprises a first frequency filter connected to said output and a second frequency filter connected to said output, wherein said third circuit element comprises an input from said first frequency filter and an input from said second frequency filter, wherein said third circuit element adjusts its output based on the low frequency input.

13. An electronic device as recited in claim 12, wherein said second circuit element further comprises a fourth circuit element to compensate for a temperature gradient across said transducer.

14. An electronic device as recited in claim 13, wherein said fourth circuit element comprises a summing amplifier to add said output signals across said bridge.

15. An electronic device as recited in claim 13, wherein said fourth circuit element comprises a summing amplifier to add output signals across said bridge and a device to provide a difference between said output signals across said bridge, wherein said summing amplifier and said device are connected to receive signal passing through said low pass filter.

16. An electronic device as recited in claim 13, wherein said fourth circuit element further comprises a device to provide a difference between said output signals across said bridge, wherein said device is connected to receive signals passing through said high pass filter.

17. An electronic device as recited in claim 13, wherein said fourth circuit element further comprises a device to provide a difference between conditioned low frequency signal and conditioned high frequency signal, wherein said difference signal is proportional to position compensated for gradient of temperature.

18. An electronic device as recited in claim 1, wherein said first circuit element comprises a variable reluctance transducer having a core, wherein said first parameter provides a measure of temperature and said second parameter provides a measure of position of said core in said transducer.

19. An electronic device as recited in claim 1, wherein said first circuit element comprises a single inductor and a member coupled to said single inductor, wherein said first parameter provides a measure of temperature and said second parameter provides a measure of position of said member with respect to said single inductor.

20. The electronic device as recited in claim 19, wherein said member comprises a conductive material.

21. The electronic device as recited in claim 19, wherein said member comprises a magnetoelastic material.

22. The electronic device as recited in claim 19, wherein said member comprises a target.

23. The electronic device as recited in claim 22, wherein said single inductor and said target are parts of a non-contacting position sensor.

24. The electronic device as recited in claim 22, wherein said target includes a material that exhibits magnetoelastic characteristics.

25. The electronic device as recited in claim 24, wherein said single inductor and said target are parts of at least one from the group consisting of a non-contacting strain sensor, a non-contacting stress sensor, and a non-contacting torque sensor.