Non-contact apparatus and method for measuring surface profile
First Claim
1. A non-contact method for measuring a surface of an object, comprising:
- projecting a rotating grid onto the surface of the object;
capturing a plurality of images of the surface of the object having the rotating grid projected thereon with an imaging device; and
determining at least one quadric surface above and at least one quadric surface below a point on the surface of the object where a pixel ray of the imaging device intersects the surface of the object.
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Abstract
Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.
49 Citations
45 Claims
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1. A non-contact method for measuring a surface of an object, comprising:
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projecting a rotating grid onto the surface of the object; capturing a plurality of images of the surface of the object having the rotating grid projected thereon with an imaging device; and determining at least one quadric surface above and at least one quadric surface below a point on the surface of the object where a pixel ray of the imaging device intersects the surface of the object. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A non-contact method for measuring the surface profile of an object, comprising:
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generating a point-type optical signal; projecting the point-type optical signal on a rotatable precision optical grating; generating a rotating pattern of light and dark lines onto the object to be measured;
recording a series of images of the rotating pattern or light and dark lines moving across the object to be measured with an image receiving device; andcalculating the surface profile of the object to be measured from the series of images, wherein calculating the surface profile of the object includes; determining a fractional gridline number for each pixel where a measurement is desired; determining the intersection of a line projected through an image plane of the image receiving device and a point on a quadric surface defined by the fractional gridline number; and determining the three dimensional absolute coordinates of the point from camera rays. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A non-contact method for measuring the surface profile of an object, comprising:
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generating a point-type optical signal; projecting the point-type optical signal on a rotatable precision optical grating; generating a rotating pattern of light and dark lines onto the object to be measured;
recording a series of images of the rotating pattern or light and dark lines moving across the object to be measured with an image receiving device; andcalculating the surface profile of the object to be measured from the series of images, wherein calculating the surface profile of the object further comprises;
determining a fractional gridline number corresponding to an intersection of a pixel array, a quadric surface, and a surface on an object being measured;
determining a pulse width of a series of contiguous black and white intensity values; and
determining a tangential pulse from the pulse width.
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17. A non-contact apparatus for measuring the surface profile of an object, comprising:
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a point-type light source; a rotatably mounted optical grating positioned in an optical path of the point-type light source, the optical grating being configured to project a moving grating image on the object; an image capturing device positioned to view the object and the moving grating image projected thereon; and a processor in communication with the image capturing device, the processor being configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom, wherein the processor is further configured to determine a fractional gridline number at each pixel on the surface of the object, compute an intersection of a three dimensional line with a quadric surface, and determine three dimensional absolute coordinates from camera rays. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. A non-contact apparatus for measuring the surface profile of an object, comprising:
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a point-type light source positioned above a measuring surface and at an acute angle to the measuring surface; a rotatably mounted optical grid positioned between the point-type light source and the measuring surface; a camera fixedly positioned above the measuring surface, the camera being configured to view the measuring surface; and a microprocessor in communication with the camera, the microprocessor being configured to receive images from the camera and generate an electronic surface profile representation of the object, wherein the microprocessor is further configured to determine a fractional gridline number at each pixel on the surface of an object being measured, compute an intersection of a three dimensional line with a quadric surface, and determine three dimensional absolute coordinates from camera rays. - View Dependent Claims (29, 30, 31, 32, 33)
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34. A non-contact apparatus for measuring the surface profile of an object, comprising:
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a point-type light source; a rotatably mounted optical grating positioned in an optical path of the point-type light source, the optical grating being configured to project a moving grating image on the object; an image capturing device positioned to view the object and the moving grating image projected thereon; and a processor in communication with the image capturing device, the processor being configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom; wherein the apparatus is calibrated by measuring and calculating a fractional grid line distance back projected to at least three planar surfaces placed at known positions in an object space. - View Dependent Claims (35, 36, 37)
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38. A non-contact method for measuring the surface profile of an object, comprising:
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generating a point-type optical signal; projecting the point-type optical signal on a rotatable precision optical grating; generating a rotating pattern of light and dark lines onto the object to be measured, wherein generating a rotating pattern includes rotating the rotatable precision optical grating at a constant velocity while the point-type optical signal is projected thereon; and
;recording a series of images of the rotating pattern or light and dark lines moving across the object to be measured with an image receiving device; and calculating the surface profile of the object to be measured from the series of images; wherein calculating the surface profile of the object further comprises;
determining a fractional gridline number corresponding to an intersection of a pixel array, a quadric surface, and a surface on an object being measured. - View Dependent Claims (39, 40, 41)
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42. A non-contact apparatus for measuring the surface profile of an object, comprising:
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a point-type light source; a rotatably mounted optical grating positioned in an optical path of the point-type light source, the optical grating being configured to project a moving grating image on the object, the rotatably mounted optical grating also being configured to be rotated at a constant speed and to project a rotating pattern of light and dark lines onto the object to be measured; an image capturing device positioned to view the object and the moving grating image projected thereon; and a processor in communication with the image capturing device, the processor being configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom; wherein the apparatus is calibrated by measuring and calculating a fractional grid line distance back projected to at least three planar surfaces placed at known positions in an object space. - View Dependent Claims (43, 44, 45)
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Specification