Method, device and security system, all for authenticating a marking

• US 7,067,824 B2
• Filed: 04/28/2001
• Issued: 06/27/2006
• Est. Priority Date: 05/16/2000
• Status: Expired due to Term

• Current Assignee: Sicpa Holding SA
• Original Assignee: Sicpa Holding SA
• Inventors: Muller, Edgar, Seto, Myron, Egger, Philipp
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): Taningco, Marcus
• Application Number:
  US10/257,983
• Publication Number:
  US 20040031931A1
• Time in Patent Office: 1,886 Days
• Field of Search: 250/458.1, 435/6, 356/364, 382/150
• US Class Current: 250/458.1
• CPC Class Codes: G06K 19/14 the marking being sensed by radiation
• CPC Class Codes: G07D 7/12 Visible light, infrared or ultraviolet radiation
• CPC Class Codes: G07D 7/121 Apparatus characterised by sensor details

Abstract

A luminescent probe marking is excited with at least one excitation pulse of at least one excitation source. The probe intensity values of emission intensity from emission radiation of the luminescent probe marking are measured in response to the excitation pulse(s) at time intervals. A probe intensity-versus-time emission function is formed of the probe intensity values, and the probe intensity-versus-time emission function is compared with at least one reference intensity-versus-time emission function after the probe intensity-versus-time emission function and the reference intensity-versus-time emission function have been normalized.

Claims

1. A method for authenticating a luminescent probe marking, said method comprising steps of:

exciting said luminescent probe marking with at least one excitation pulse of at least one excitation source,

measuring probe intensity values of emission radiation of said luminescent probe marking in response to said at least one excitation pulse at time intervals,

forming a probe intensity-versus-time emission function of said probe intensity values,

normalizing said probe intensity-versus-time emission function, and then

comparing said probe intensity-versus-time emission function with at least one reference intensity-versus-time emission function.

2. A method according to claim 1, wherein

said luminescent probe marking is part of a probe sample to be authenticated, and

specific emission characteristics of said luminescent probe marking are measured, said specific emission characteristics including at least one excitation wavelength of said excitation pulse, at least one emission wavelength of said emission radiation and probe intensity values of emission intensity at time intervals for at least one said emission wavelength.

3. A method according to claim 2, wherein

said at least one luminescent reference marking is part of a reference sample and

specific emission characteristics of said at least one luminescent reference marking are measured,

said specific emission characteristics including at least one excitation wavelength of said excitation pulse, at least one emission wavelength of said emission radiation and reference intensity values of emission intensity at time intervals for at least one said emission wavelength.

4. A metbod according to claim 3, wherein reference intensity values, at least one reference intensity-versus-time emission function or reference intensity values and at least one reference intensity-versus-time emission function are stored in at least one memory device.

5. A method according to claim 4, wherein said at least one reference intensity-versus-time emission function is stored in a normalized form or in a non-normalized form.

6. A method according to claim 1, wherein said luminescent probe marking or a respective reference marking are excited with at least one excitation pulse from at least one excitation source selected from the group consisting of laser and light emitting diode.

7. A method according to claim 1, wherein said luminescent probe marking or a respective reference marking are excited with at least one excitation pulse of electrons.

8. A device for authenticating a luminescent probe marking, said device comprising:

at least one detector for measuring probe intensity values of emission intensity from emission radiation of said luminescent probe marking in response to at least one excitation pulse generated by at least one excitation source at time intervals,

at least one processor for forming a probe intensity-versus-time emission function of said probe intensity values,

at least one processor for comparing said probe intensity-versus-time emission function with at least one reference intensity-versus-time emission function and

at least one processor for normalizing said probe intensity-versus-time emission function prior to comparison with a normalized reference probe intensity-versus-time emission function.

9. A device according to claim 8, wherein said device comprises

at least one memory device for storing reference intensity values of emission intensity at time intervals for at least one wavelength of emission radiation of said luminescence reference marking, for storing at least one reference intensity-versus-time emission function formed from reference intensity values or for storing reference intensity values of emission intensity at time intervals for at least one wavelength of emission radiation of said luminescence reference marking and at least one reference intensity-versus-time emission function formed from said reference intensity values.

10. A device according to claim 8, wherein said device comprises said at least one excitation source.

11. A device according to claim 8, wherein at least one detector comprises a wavelength selector.

12. A device according to claim 8, wherein said at least one detector converts emission intensity into electric signals of probe intensity values and respective reference intensity values and that said at least one processor samples said electric signals to form a probe intensity-versus-time emission function of said probe intensify values or a respective reference intensity-versus-time emission function of said reference intensity values.

13. A device according to claim 8, wherein said device comprises at least one spectrometer for differentiating between two or more emission wavelengths,

said at least one detector being an array-photo detector for measuring the emission radiation at two or more emission wavelengths, allowing a simultaneous measuring of probe intensity values of emission radiation of a luminescent probe marking or a respective simultaneous measuring of reference intensity values of emission radiation of a luminescent reference marking.

14. A device according to claim 13, wherein said at least one array-photo detector is a two dimensional CCD array having a first row of photosensitive pixels serving as photo detecting array, and remaining rows of pixels serving as a primary storage device for spectral information as a function of time through a line-shifting process.

15. A security system for authentication a luminescent probe marking, said security system comprising:

a device according to claim 8,

at least one reference sample comprising at least one luminescent reference marking for measuring reference intensity values of emission intensity at time intervals for at least one wavelength of the emission radiation of said luminescent reference marking and

at least one probe sample comprising at least one luminescent probe marking for measuring probe intensity values of emission intensity at time intervals for at least one wavelength of the emission radiation of said luminescent probe marking.

16. A security system according to claim 15, wherein at least one of said probe samples is part of an ink and for coating composition of an article to be authenticated.

17. A security system according to claim 15, wherein at least one of said probe samples is contained in a bulk material of an article to be authenticated.