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Alignment systems for imprint lithography

  • US 7,070,405 B2
  • Filed: 08/01/2002
  • Issued: 07/04/2006
  • Est. Priority Date: 08/01/2002
  • Status: Expired due to Term
First Claim
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1. A system for forming a pattern on a substrate comprising:

  • a body;

    a patterned template, wherein the patterned template is substantially transparent to an activating light;

    a motion stage coupled to the body, wherein the motion stage is configured to support a substrate, and wherein the motion stage is configured to move the substrate along a plane substantially parallel to the patterned template;

    an imprint head coupled to the body, wherein the imprint head is configured to hold the patterned template proximate to the substrate during use, wherein the imprint head comprises a fine orientation system, wherein the fine orientation system is configured to allow motion of the patterned template with respect to the substrate to achieve a substantially parallel orientation of the patterned template with respect to the substrate;

    a liquid dispenser coupled to the body, wherein the liquid dispenser is configured to dispense an activating light curable liquid onto at least a portion of the substrate during use;

    a force detector coupled to the imprint head, wherein the force detector is configured to determine a resistive force applied to the patterned template by the liquid when the patterned template contacts the liquid;

    an activating light source optically coupled to the patterned template, wherein the activating light source is configured to direct the activating light through the patterned template during use;

    a first optical imaging device coupled to the imprint head;

    a second optical imaging device coupled to the motion stage, wherein the second optical imaging device is coupled to the motion stage such that the second optical imaging device and the substrate move together during use;

    a system alignment target optically coupled to the first optical imaging device; and

    a displacement detector coupled to the body, wherein the displacement detector is configured to determine a relative displacement of the substrate with respect to the patterned template.

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