Wafer-level package having test terminal
First Claim
1. A wafer-level package comprising:
- a semiconductor wafer having at least one semiconductor chip circuit forming region that includes a semiconductor chip circuit and a plurality of chip terminals, said chip terminals including at least one test chip terminal and at least one non-test chip terminal;
at least one external connection terminal electrically connected to said at least one non-test chip terminal;
at least one redistribution trace provided on said semiconductor wafer, a first end of said redistribution trace being electrically connected to said at least one test chip terminal and a second end of said redistribution trace being extended out to a position offset from one of said chip terminals;
at least one test terminal, exclusively for testing, provided in an outer region outside said semiconductor chip circuit forming region, said second end of said redistribution trace being electrically connected to said at least one test-terminal; and
an insulating material covering at least said redistribution trace, said at least one external connection terminal and said at least one test terminal being exposed from said insulating material,wherein said at least one test terminal is provided in said outer region and corresponds to said at least one semiconductor chip circuit forming region.
3 Assignments
0 Petitions
Accused Products
Abstract
A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals and non test chip terminals, at least one external connection terminal, at least one redistribution trace provided on the semiconductor wafer, at least one testing member, and an insulating material. A first end of the redistribution trace is connected to one of the test chip terminals and a second end of said redistribution trace is extended out to a position offset from the chip terminals. The testing member is provided in an outer region of the semiconductor chip circuit forming region, and the second end of the redistribution trace is connected to the testing member.
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Citations
9 Claims
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1. A wafer-level package comprising:
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a semiconductor wafer having at least one semiconductor chip circuit forming region that includes a semiconductor chip circuit and a plurality of chip terminals, said chip terminals including at least one test chip terminal and at least one non-test chip terminal; at least one external connection terminal electrically connected to said at least one non-test chip terminal; at least one redistribution trace provided on said semiconductor wafer, a first end of said redistribution trace being electrically connected to said at least one test chip terminal and a second end of said redistribution trace being extended out to a position offset from one of said chip terminals; at least one test terminal, exclusively for testing, provided in an outer region outside said semiconductor chip circuit forming region, said second end of said redistribution trace being electrically connected to said at least one test-terminal; and an insulating material covering at least said redistribution trace, said at least one external connection terminal and said at least one test terminal being exposed from said insulating material, wherein said at least one test terminal is provided in said outer region and corresponds to said at least one semiconductor chip circuit forming region. - View Dependent Claims (4, 5)
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2. A wafer-level package comprising:
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a semiconductor wafer having a plurality of semiconductor chip circuit forming regions each including a semiconductor chip circuit and a plurality of chip terminals, said chip terminals including at least one test chip terminal and at least one non-test chip terminal; at least one external connection terminal electrically connected to said at least one non-test chip terminal; at least one redistribution trace provided on said semiconductor wafer, a first end of said redistribution trace being electrically connected to said at least one test chip terminal and a second end of said redistribution trace being extended out to a position offset from one of said chip terminals; a plurality of test terminals, exclusively for testing, provided in an outer region outside said semiconductor chip circuit forming region, said second end of said redistribution trace being electrically connected to at least one of the test terminals; a common line electrically connecting at least two of the test terminals; and an insulating material covering at least said redistribution trace, said at least one external connection terminal and said test terminals being exposed from said insulating material, wherein said test terminals corresponding to a plurality of said semiconductor chip circuit forming regions, said test terminals and said common line being provided in said outer region. - View Dependent Claims (6, 7)
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3. A wafer-level semiconductor device comprising:
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a semiconductor wafer having chip circuit forming regions, each of said chip circuit forming regions having at least one test chip terminal provided therein; at least one test terminal provided in an outer region outside the chip circuit forming regions; and at least one redistribution line electrically connecting said at least one test terminal and said at least one test chip terminal. - View Dependent Claims (8, 9)
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Specification