Low-current probe card

• US 7,071,718 B2
• Filed: 06/08/2005
• Issued: 07/04/2006
• Est. Priority Date: 12/01/1995
• Status: Expired due to Fees

• Current Assignee: Cascade Microtech Incorporated (FormFactor Incorporated)
• Original Assignee: Gascade Microtech Incorporated
• Inventors: Schwindt, Randy J.
• Primary Examiner(s): Nguyen, Vinh P.
• Application Number:
  US11/148,707
• Publication Number:
  US 20050231226A1
• Time in Patent Office: 391 Days
• Field of Search: 324754-762, 324/72.5, 439/482, 439/828, 174/68.1, 174/36, 174/102.SC, 174/102.R
• US Class Current: 324/754.03
• CPC Class Codes: G01R 1/06 Measuring leads; Measuring probes G01R19/145, G01R19/165 take precedence
• CPC Class Codes: G01R 1/07342 the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
• CPC Class Codes: G01R 1/07371 using an intermediate card or back card with apertures through which the probes pass
• CPC Class Codes: G01R 1/18 Screening arrangements against electric or magnetic fields, e.g. against earth's field
• CPC Class Codes: G01R 31/08 Locating faults in cables, transmission lines, or networks
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28

Abstract

A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included thereon terminate below the opening in a pattern suitable for probing a test device. A plurality of cables are attached to the card for respectively connecting each device to a corresponding channel of a test instrument. The on-board portion of each cable is of coaxial type and includes an inner layer between the inner dielectric and outer conductor for suppressing the triboelectric effect. An inner conductive area and a conductive backplane that are respectively located below and on one side of each device are set to guard potential via the outer conductor of the corresponding cable so as to guard the signal path on the other side of the device. The lead-in portion of each cable, which is detachably connected to the corresponding on-board portion through a plug-in type connector, is of triaxial type and includes, besides the inner layer between the inner dielectric and outer conductor, a second inner dielectric and second outer conductor. A conductive cover and an outer conductive area that substantially enclose the components on the card are set to shield potential via the second outer conductor and connector.

Claims

1. A probe card for probing a test device comprising:

(a) said card defining an opening;

(b) a plurality of probing devices for probing a probing site, said probing devices each including an elongate conductive path that extends below said opening;

(c) said probing devices being arranged about said opening so that said probing elements terminate below said opening in a pattern suitable for probing said sites; and

(d) a plurality of cables for connecting each probing device to a corresponding channel of a test instrument, each cable including an inner conductor, an inner dielectric and an outer conductor, each inner conductor being electrically connected to a corresponding one of said conductive paths;

(e) a conductive cover positioned over said card;

(f) a conductive region of said card surrounding said opening;

(g) said conductive region of said card electrically interconnected to said conductive cover.

2. The card of claim 1 further comprising each cable further including an inner layer of material between said inner dielectric and said outer conductor of suitable composition for reducing triboelectric current generation between said inner dielectric and said outer conductor to less than that which would occur were said inner dielectric and said outer conductor to directly adjoin each other.

3. The probe card of claim 1 wherein said card includes a plurality of inner conductive areas surrounding said opening in circumferentially spaced relationship to each other.

4. The probe card of claim 2 wherein said dielectric board includes said conductive region surrounding said plurality of inner conductive areas in spaced relationship thereto.

5. The probe card of claim 1 further including a cable connector through which said cables pass directly into a shielded enclosure formed by said cover, said cable connector providing an electrical connection path interconnecting said shielding conductors and said cover.

6. The probe card of claim 1 wherein said card is principally composed of glass-epoxy material.