Architecture for generating adaptive arbitrary waveforms
First Claim
1. A system that facilitates testing a device, comprising:
- a signal component that generates an output signal for application to the device;
a monitor component that monitors one or more parameters of the device while the device is being tested, and communicates with the signal component such that the output signal applied to the device during the test is automatically changed;
wherein the output signal is pre-defined in advance of the test, such that a sequence of waveform slices are selectable so as to constitute the output signal and events that trigger switching from one slice of the sequence to another slice of the sequence during the test.
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Abstract
A test system having a feedback loop that facilitates adjusting an output test waveform to a DUT/CUT (Device Under Test/Circuit Under Test) on-the-fly according to changing DUT/CUT parameters. The system includes a tester having an arbitrary waveform generator (AWG) and a data acquisition system (DAS) that monitors the status of the DUT/CUT. The AWG and DAS connect to the DUT/CUT through a feedback loop where the AWG outputs the test waveform to the DUT/CUT, the DAS monitors the DUT/CUT parameters, and the DAS analyzes and communicates changes to the AWG to effect changes in the output waveform, when desired. The AWG builds the output waveform in small slices (or segments) that are assembled together through a process of selection and calibration. The feedback architecture facilitates a number of changes in the output waveform, including a change in the original order of the preassembled slices, and changes in the magnitude/shape of the output waveform.
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Citations
30 Claims
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1. A system that facilitates testing a device, comprising:
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a signal component that generates an output signal for application to the device; a monitor component that monitors one or more parameters of the device while the device is being tested, and communicates with the signal component such that the output signal applied to the device during the test is automatically changed;
wherein the output signal is pre-defined in advance of the test, such that a sequence of waveform slices are selectable so as to constitute the output signal and events that trigger switching from one slice of the sequence to another slice of the sequence during the test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system that facilitates characterizing electrical behavior of a cell, comprising:
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a arbitrary waveform generator component that generates an output waveform for application to the cell; a data acquisition component that monitors at least one of voltage across the cell and current through the cell to determine a change in one or more electrical parameters of the cell while the cell is being tested, a monitor component communicates with a signal component such that the signal component changes the output waveform in response to a change in the electrical behavior of the cell; and the output signal is specified prior to the test, by selecting a series of waveform slices that form the output signal and events that trigger changing from one slice of the series to another slice of the series while conducting the test. - View Dependent Claims (11, 12, 13, 14)
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15. A system that facilitates testing a device, comprising:
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a housing; a waveform generator component located in the housing that generates an output signal for application to the device; a data acquisition component located in the housing that monitors one or more parameters of the device while the device is being tested, and communicates with the waveform generator component such that the waveform generator component changes the output signal being applied to the device during the test; a trigger component located in the housing that communicates with the data acquisition component to detect a change in a state of the device during the test; a user interface that allows interaction with a user for configuration and presentation of test information; and the output signal is specified ahead of the test, by selecting a series of slices that will make up the output signal and events that trigger switching from one slice of the series to another slice of the series during the test. - View Dependent Claims (16, 17, 18, 19)
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20. A method of testing a device, comprising:
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defining an output signal in advance of the test; providing a set of base waveforms in a memory; defining initial settings of a test waveform to be applied to the device; slicing the set of base waveforms into waveform slices; assembling selected waveform slices in a sequence to form the test waveform; choosing events that trigger switching from one slice of a sequence to another slice of a sequence during test; applying the test waveform to the device during a test phase; and changing the test waveform in response to a measured change in the device. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27)
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28. A system that facilitates testing a cell, comprising:
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means for defining an output signal in advance of the test; means for providing a set of base waveforms in a memory; means for slicing the set of base waveforms into waveform slices; means for determining a sequence of the waveform slices that constitute a test waveform; means for selecting one or more events that trigger switching from one slice to a next slice; means for assembling selects ones of the waveform slices to form the test waveform; means for applying the test waveform to the cell during a test phase; and means for changing the test waveform in response to a measured change in the cell during the test phase. - View Dependent Claims (29, 30)
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Specification