Method and system for performing crosstalk analysis
First Claim
1. A method of performing crosstalk analysis for the design of an integrated circuit, comprising:
- generating a set of multi-variable patterns corresponding to one or more configurations of IC components;
determining a delay impact of cross-talk for each of the multiple-variable patterns;
analyzing an IC design to determine whether any of the multi-variable patterns are present in the IC design; and
determining a performance effect on the IC design based upon the delay impacts respectively associated with the multi-variable patterns that are present in the IC design, wherein device-level simulation is performed to generate the set of multi-variable patterns and delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2 where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size.
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Abstract
Disclosed is an improved approach for performing crosstalk and signal integrity analysis in which multiple variables are taken into account when analyzing the effects of on-chip crosstalk, such as for example coupled wire length, ration of coupling capacitance, and aggressor and victim driver types. Rather than performing a full-chip simulation, the potential crosstalk effects can be pre-characterized by performing simulation/modeling over specific net portions by systematically changing the values of these multiple variables. A set of patterns characterized from the variables are formed from the modeling. During the analysis process, the IC design is checked of the presence of the patterns, from which is produced the expected delay impact for crosstalk in the design.
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Citations
47 Claims
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1. A method of performing crosstalk analysis for the design of an integrated circuit, comprising:
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generating a set of multi-variable patterns corresponding to one or more configurations of IC components; determining a delay impact of cross-talk for each of the multiple-variable patterns; analyzing an IC design to determine whether any of the multi-variable patterns are present in the IC design; and determining a performance effect on the IC design based upon the delay impacts respectively associated with the multi-variable patterns that are present in the IC design, wherein device-level simulation is performed to generate the set of multi-variable patterns and delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A system of performing crosstalk analysis for the design of an integrated circuit, comprising:
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means for generating a set of multi-variable patterns corresponding to one or more configurations of IC components; means for determining a delay impact of crosstalk for each of the multiple-variable patterns; means for analyzing an IC design to determine whether any of the multi-variable patterns are present in the IC design; and means for determining a performance effect on the IC design based upon the delay impacts respectively associated with the multi-variable patterns that are present in the IC design, wherein device-level simulation is performed to generate the set of multi-variable patterns and delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23)
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24. A computer program product comprising a computer usable medium having executable code to execute a process for performing crosstalk analysis for the design of an integrated circuit, the process comprising:
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generating a set of multi-variable patterns corresponding to one or more configurations of IC components; determining a delay impact of cross-talk for each of the multiple-variable patterns; analyzing an IC design to determine whether any of the multi-variable patterns in the set of multi-variable patterns are present in the IC design; and determining a performance effect on the IC design based upon the delay impacts respectively associated with the multi-variable patterns that are present in the IC design, wherein device-level simulation is performed to generate the set of multi-variable patterns and delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32)
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33. A method for performing crosstalk analysis for the design of an integrated circuit, comprising:
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characterizing a set of IC components based upon wirelength values, aggressor driver type values, victim driver type values, and ratio of coupling capacitance values; identifying a set of patterns based upon the wirelength values, the aggressor driver type values, the victim driver type values, and the ratio of coupling capacitance values; analyzing an IC design to identify the existence of any patterns from the set of patterns; and determining delay impact of crosstalk based upon identifying the existence of the patterns, wherein delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size. - View Dependent Claims (34, 35, 36, 37, 38, 39, 40)
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41. A system for performing crosstalk analysis for the design of an integrated circuit, comprising:
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means for characterizing a set of IC components based upon wirelength values, aggressor driver type values, victim driver type values, and ratio of coupling capacitance values; means for identifying a set of patterns based upon the wirelength values, the aggressor driver type values, the victim driver type values, and the ratio of coupling capacitance values; means for analyzing an IC design to identify the existence of any patterns from the set of patterns; and means for determining delay impact of crosstalk based upon identifying the existence of the patterns, wherein delay impact is fitted using the following fitting parameters;
D=C*L+C2*L+C*L2+C2*L2+(C*L+C2*L+C*L2+C2*L2)*Ax+(C*L+C2*L+C*L2+C2*L2)*Ax2where C is coupling Cap ratio, L is coupling wire length (mm), and Ax is Aggressor driver size. - View Dependent Claims (42, 43, 44, 45, 46, 47)
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Specification