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Probe for combined signals

  • US 7,075,320 B2
  • Filed: 03/09/2005
  • Issued: 07/11/2006
  • Est. Priority Date: 11/13/2002
  • Status: Expired due to Fees
First Claim
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1. A method of testing a device having a signal contact pad, said method comprising the step of simultaneously transmitting a direct current and a modulated signal to said signal contact pad, said modulated signal being conducted over a signal path having a resistance greater than a resistance of a signal path for conduction of said direct current.

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