Probe for combined signals
First Claim
1. A method of testing a device having a signal contact pad, said method comprising the step of simultaneously transmitting a direct current and a modulated signal to said signal contact pad, said modulated signal being conducted over a signal path having a resistance greater than a resistance of a signal path for conduction of said direct current.
1 Assignment
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Accused Products
Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
239 Citations
4 Claims
- 1. A method of testing a device having a signal contact pad, said method comprising the step of simultaneously transmitting a direct current and a modulated signal to said signal contact pad, said modulated signal being conducted over a signal path having a resistance greater than a resistance of a signal path for conduction of said direct current.
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3. A probe for simultaneously transmitting a plurality of signals to a signal contact pad of a device, said probe comprising:
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(a) a conductor connected to a source of direct current and selectively engageable with said signal contact pad; and (b) a conductor connected to a source of a modulated signal and selectively connectable to said signal contact pad, said conductor of said modulated signal having a resistance greater than a resistance of said conductor of said direct current. - View Dependent Claims (4)
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Specification