Imaging apparatus and method with event sensitive photon detection
First Claim
1. A method for examining an object, comprising:
- directing an externally generated radiation beam towards an object to generate a positron-electron annihilation process to produce photons in the object;
detecting the photons;
generating a signal in response to the detected photons; and
determining a characteristic of the object based at least on the signal.
3 Assignments
0 Petitions
Accused Products
Abstract
An imaging apparatus (10) includes a photon detector (20) and an accessing circuit (44) coupled thereto. The photon detector (20) detects photons and generates signals in response thereto. The accessing circuit (44) reads out the signals from the photon detector (20) at a sufficiently high rate so that it operates in an event sensitive mode. The apparatus (10) also includes a signal processing module (15) for processing the signals and generating data regarding the images of the object. In accordance with various embodiments of the present invention, the signal processing module (15) may include a spatial resolution circuit (56), a photon energy resolution circuit (57), a temporal resolution circuit (58), or any combination thereof.
70 Citations
52 Claims
-
1. A method for examining an object, comprising:
-
directing an externally generated radiation beam towards an object to generate a positron-electron annihilation process to produce photons in the object; detecting the photons; generating a signal in response to the detected photons; and determining a characteristic of the object based at least on the signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
-
-
19. A system for examining an object, comprising:
-
means for externally generating a radiation beam and directing the radiation beam towards an object to generate a positron-electron annihilation process to produce photons in the object; means for detecting the photons; means for generating a signal in response to the detected photons; and means for determining a characteristic of the object based at least on the signal. - View Dependent Claims (20, 21, 22, 23)
-
-
24. A method for examining an object, comprising:
-
generating a particle in an object; detecting the particle; generating a signal using a detector in response to the detected particle; accessing the generated signal using an accessing circuit that has an accessing rate equal to or greater than a signal generating rate associated with the detector; and analyzing the signal to generate data regarding the object. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
-
-
35. A system for examining an object, comprising:
-
means for generating a particle in an object; means for detecting the particle; means for generating a signal in response to the detected particle; an accessing circuit for accessing the generated signal the accessing circuit having an accessing rate ectual to or greater than a signal generating rate associated with the means for generating; and means for analyzing the signal to generate data regarding the object. - View Dependent Claims (36, 37, 38, 39, 40, 41)
-
-
42. An imaging apparatus, comprising:
-
a conversion panel configured to generate a light photon in response to a radiation; a photo detector array aligned with the conversion panel and configured to generate a signal in response to the light photon received from the conversion panel; an access circuit coupled to the photo detector array, the accessing circuit having accessing rate equal to or greater than a signal generating rate associated with the photo detector; and a signal processing circuit coupled to the access circuit and configured to generate image data in response to the signal received by the access circuit. - View Dependent Claims (43, 44, 45, 46, 47, 48, 49, 50, 51, 52)
-
Specification