Inspection method, inspection apparatus, and facility diagnosis unit
First Claim
1. An inspection method using an inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status of an inspection object on the basis of the extracted amount of characteristic, the method comprising the steps of:
- determining whether or not the status complies with a normal status by using a normal knowledge that is generated on the basis of only data of the normal status at an initial stage; and
determining the status by using the normal knowledge and an abnormal kind knowledge, the abnormal kind knowledge being generated on the basis of data of the abnormal status that are collected in accordance with repeat of the normal status determination,wherein, as a result of determination of the status by using the normal knowledge and the abnormal kind knowledge, if the abnormal kind is not detected on the basis of the abnormal kind knowledge, deleting the abnormal kind knowledge of the abnormal kind, the determination processing is carried out with the abnormal kind knowledge of the abnormal kind deleted.
1 Assignment
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Accused Products
Abstract
To inspect a status of an inspection object by using an inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status on the basis of the extracted amount of characteristic. Specifically, the inspection apparatus uses a normal knowledge that is generated on the basis of only the data of a normal status at an initial stage to determine whether or not the status of the inspection object complies with the normal status. The inspection apparatus generates an abnormal kind knowledge by abnormal kind on the basis of the data of an abnormal status that are collected in accordance with repeat of the determination, and then, determines the status by using the normal knowledge and the abnormal kind knowledge.
5 Citations
10 Claims
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1. An inspection method using an inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status of an inspection object on the basis of the extracted amount of characteristic, the method comprising the steps of:
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determining whether or not the status complies with a normal status by using a normal knowledge that is generated on the basis of only data of the normal status at an initial stage; and determining the status by using the normal knowledge and an abnormal kind knowledge, the abnormal kind knowledge being generated on the basis of data of the abnormal status that are collected in accordance with repeat of the normal status determination, wherein, as a result of determination of the status by using the normal knowledge and the abnormal kind knowledge, if the abnormal kind is not detected on the basis of the abnormal kind knowledge, deleting the abnormal kind knowledge of the abnormal kind, the determination processing is carried out with the abnormal kind knowledge of the abnormal kind deleted.
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2. An inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status of an inspection object on the basis of the extracted amount of characteristic, having:
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a first mode for determining whether or not the status complies with a normal status by using a normal knowledge that is generated on the basis of only data of the normal status of the inspection object; and a second mode for determining whether or not the status is normal and whether or not the status complies with a prescribed abnormal kind by using the normal knowledge that is generated on the basis of the data of the normal status of the inspection object and an abnormal kind knowledge that is generated on the basis of data of the prescribed abnormal kind; wherein, at the initial stage when the abnormal kind is not specified, the inspection apparatus determines the status in the first mode; and
the inspection apparatus determines the status in the second mode at a prescribed timing after the initial stage. - View Dependent Claims (3, 4, 5)
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6. An inspection apparatus for extracting amount of characteristic to an inputted waveform signal and determining a status of an inspection object on the basis of the extracted amount of characteristic, comprising:
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a normal status determining device for determining whether or not the status complies with a normal status by using a normal knowledge that is generated on the basis of only data of the normal status; and an abnormal kind determining device for determining whether or not the status complies with a prescribed abnormal kind by using an abnormal kind knowledge that is generated on the basis of data of the prescribed abnormal kind; wherein, at the initial stage when the abnormal kind is not specified, the inspection apparatus determines the status only by the normal status determining device; and
the inspection apparatus determines overall the status by operating the normal status determining device and the abnormal kind determining device at a prescribed timing after the initial stage. - View Dependent Claims (7, 8, 9)
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10. A facility diagnosis unit for extracting amount of characteristic to an inputted waveform signal and determining a status of a facility on the basis of the extracted amount of characteristic, comprising:
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a normal status determining device for determining whether or not the status complies with a normal status by using a normal knowledge that is generated on the basis of only data of the normal status of the facility that is a diagnosis object; and an abnormal kind determining device for determining whether or not the status complies with a prescribed abnormal kind by using an abnormal kind knowledge that is generated on the basis of data of the prescribed abnormal kind; wherein, at the initial stage when the abnormal kind is not specified, the facility diagnosis unit determines the status only by the normal status determining device; and
the facility diagnosis unit determines overall the status of the facility by operating the normal status determining device and the abnormal kind determining device at a prescribed timing after the initial stage.
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Specification