Spatially patterned light-blocking layers for radiation imaging detectors

• US 7,081,628 B2
• Filed: 11/10/2003
• Issued: 07/25/2006
• Est. Priority Date: 11/10/2003
• Status: Active Grant

• Current Assignee: GE Medical Systems Global Technology Company LLC (GE Healthcare Technologies, Inc.)
• Original Assignee: GE Medical Systems Global Technology Company LLC (GE Healthcare Technologies, Inc.)
• Inventors: Albagli, Douglas, Aufrichtig, Richard, Granfors, Paul Richard
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): Boosalis, Faye P
• Application Number:
  US10/705,091
• Publication Number:
  US 20050098731A1
• Time in Patent Office: 988 Days
• Field of Search: 250/370.11, 250/370.09, 250/370.08, 250/208.1, 250/338.4, 250/370.14, 378/98.8
• US Class Current: 250/370.11
• CPC Class Codes: G01T 1/2928 using solid state detectors
• CPC Class Codes: H01L 27/14609 Pixel-elements with integrated switching, control, storage or amplification elements scanning details of imagers (circuitry of solid-state image sensors H04N25/00); circuitry of imagers H04N25/70
• CPC Class Codes: H01L 27/14623 Optical shielding
• CPC Class Codes: H01L 27/14663 Indirect radiation imagers, e.g. using luminescent members

Abstract

Spatially patterned light-blocking layers for radiation imaging detectors are described. Embodiments comprise spatially patterned light-blocking layers for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector. These light-blocking layers may block light from each switching element in a predetermined arrangement of switching elements that are read out last, or in any other suitable pattern.

Claims

1. A spatially patterned light-blocking layer for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises half or less than all of the switching elements in the detector.

2. The spatially patterned light-blocking layer of claim 1, wherein the spatially patterned light-blocking layer blocks light from each switching element in a predetermined arrangement of switching elements that are read out last.

3. The spatially patterned light-blocking layer of claim 1, wherein the spatially patterned light-blocking layer is incorporated into an existing layer in the amorphous silicon flat panel x-ray detector.

4. The spatially patterned light-blocking layer of claim 1, wherein the spatially patterned light-blocking layer is incorporated as an additional layer in the amorphous silicon flat panel x-ray detector.

5. The spatially patterned light-blocking layer of claim 1, wherein the spatially patterned light-blocking layer comprises a material that is opaque to light.

6. The spatially patterned light-blocking layer of claim 5, wherein the material comprises at least one of:

a light-absorbing conductive material, a semiconductor material, a light-absorbing nonconductive material, a metal oxide, a metal compound, molybdenum (Mo), aluminum (Al), tantalum (Ta), tungsten (W), chromium (Cr), silver (Ag), titanium (Ti), tin (Sn), zirconium (Zr), gold (Au), p+ amorphous silicon, n+ amorphous silicon, undoped amorphous silicon, and “

black”

polyimide.

7. A radiation imaging detector comprising:

a detector substrate;

an amorphous silicon array disposed on the detector substrate, the amorphous silicon array comprising;

a plurality of light-sensitive imaging elements; and

a plurality of switching elements, each switching element operatively coupled to an associated light-sensitive imaging element;

a scintillator disposed over and optically coupled to the amorphous silicon array; and

a spatially patterned light-blocking layer positioned to block light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises half or less than all of the switching elements in the detector.

8. The radiation imaging detector of claim 7, wherein the spatially patterned light-blocking layer comprises a material that is opaque to light.

9. The radiation imaging detector of claim 8, wherein the material comprises at least one of:

a light-absorbing conductive material, a semiconductor material, a light-absorbing nonconductive material, a metal oxide, a metal compound, molybdenum (Mo), aluminum (Al), tantalum (Ta), tungsten (W), chromium (Cr), silver (Ag), titanium (Ti), tin (Sn), zirconium (Zr), gold (Au), p+ amorphous silicon, n+ amorphous silicon, undoped amorphous silicon, and “

black”

polyimide.

10. The radiation imaging detector of claim 7, wherein each switching element comprises a field effect transistor.

11. The radiation imaging detector of claim 7, wherein each light-sensitive imaging element comprises at least one of:

a photodiode, and a phototransistor.

12. The radiation imaging detector of claim 7, wherein the spatially patterned light-blocking layer blocks light from each switching element in a predetermined arrangement of switching elements that are read out last.

13. The radiation imaging detector of claim 7, wherein the spatially patterned light-blocking layer is incorporated into an existing layer in the amorphous silicon array.

14. The radiation imaging detector of claim 7, wherein the spatially patterned light-blocking layer comprises an additional layer in the amorphous silicon array.

15. The radiation imaging detector of claim 7, wherein the radiation imaging detector is used for at least one of:

medical imaging, nondestructive testing of parts, and detecting contraband.

16. A spatially patterned light-blocking layer for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector, wherein the spatially patterned light-blocking layer blocks light from each switching element in a predetermined arrangement of switching elements that are read out last.