Tilt detection in illumination source

• US 7,083,287 B2
• Filed: 05/13/2003
• Issued: 08/01/2006
• Est. Priority Date: 05/13/2003
• Status: Expired due to Fees

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Inventors: Pate, Michael A
• Primary Examiner(s): Perkey, W. B.
• Assistant Examiner(s): Blackman, Rochelle
• Application Number:
  US10/437,552
• Publication Number:
  US 20040227904A1
• Time in Patent Office: 1,176 Days
• Field of Search: 353/85, 353/87, 353/69, 353/70, 353/119, 353/121, 353/122, 348/745, 348/746, 348/806, 362/21, 362/269, 362/277, 362/282, 362/285, 362/287, 362/296
• US Class Current: 353/85
• CPC Class Codes: G03B 21/2046 Positional adjustment of light sources

Abstract

A method of monitoring an illumination source including a reflector and a lamp. A reference orientation is defined where the reflector and a light producing luminary of the lamp are aligned to optimize light intensity reflected from the luminary to a desired target. The orientation of the lamp is monitored, and changes from the reference orientation are reported as an indication of a reduction in light intensity reflected from the luminary toward the desired target.

Claims

1. A method of making a projector having an image generating assembly, comprising:

optimizing light intensity reflected by a reflector of an illumination source when the image generating assembly is aligned with at least one reference axis, the light intensity being related to position of a luminary relative to the reflector;

associating a tilt sensor with the image generating assembly to determine a tilt of the image generating assembly relative to the reference axis, wherein tilt of the image generating assembly effects positional change of the luminary relative to the reflector; and

operatively coupling a control system to the tilt sensor, wherein the control system is configured to report tilt of the image generating assembly relative to the reference axis that exceeds a predetermined minimum threshold to diagnose a decrease in light intensity of the illumination source.

2. The method of claim 1, wherein optimizing light intensity includes positioning the luminary at a focus of the reflector.

3. An image projection system, comprising:

an image generating assembly configured to receive an input signal and project an image based on the input signal, the image generating assembly including an illumination source with a light intensity related to position of a luminary relative to a reflector, light intensity being optimized when the image generating assembly is aligned with at least one reference axis; and

a tilt sensor configured to diagnose a decrease light intensity of the illumination source due to a gravitational shift of the luminary upon determining a tilt between the image generating assembly and the at least one reference axis.

4. The image projection system of claim 3, wherein the tilt sensor is configured to determine tilt between the illumination source and at least one reference axis.

5. The image projection system of claim 4, wherein the illumination source is configured to be selectively adjusted to optimize projected light intensity.

6. The image projection system of claim 4, wherein the tilt sensor is positioned in a fixed relationship relative to the illumination source.

7. The image projection system of claim 3, wherein a control system is operatively coupled to the tilt sensor and configured to report the determined tilt.

8. The image projection system of claim 7, wherein the control system includes a screen configured to visually report the determined tilt.

9. The image projection system of claim 7, wherein the control system includes a video output configured to send a video signal to the image generating assembly to project a visual report of the determined tilt onto a display surface.

10. The image projection system of claim 7, wherein the control system includes a sound transducer configured to audibly report the determined tilt.

11. The image projection system of claim 3, wherein the illumination source, comprises:

an envelope bounding a volume of electrically conductive plasma;

an anode extending into the envelope;

a cathode extending into the envelope, wherein the anode and the cathode are collectively configured to generate a plasma fireball in the envelope; and

a reflector configured to reflect light from the plasma fireball to a modulator of the image projection system.

12. The image projection system of claim 11, wherein the electrically conductive plasma includes high-pressure mercury plasma.

13. The image projection system of claim 11, wherein the electrically conductive plasma includes high-pressure xenon plasma.

14. An image projection system, comprising:

means for receiving an input signal;

means for projecting an image based on the input signal, the means for projecting including an illumination source with a light intensity related to position of a luminary relative to a reflector; and

means for diagnosing a decrease in light intensity of the illumination source by monitoring an orientation of the image projection system, wherein a change in orientation of the image projection system effects a gravitational shift of the luminary relative to the reflector.

15. The image projection system of claim 14, further comprising means for increasing projected light intensity by adjusting the orientation of at least a portion of the image projection system.

16. The image projection system of claim 14, further comprising means for reporting the diagnosed decrease in projected light intensity.