Fail judging method for analysis and analyzer

• US 7,083,712 B2
• Filed: 11/18/2002
• Issued: 08/01/2006
• Est. Priority Date: 11/20/2001
• Status: Expired due to Term

• Current Assignee: ARKRAY, Inc, PHC Corporation (PHC Holdings Corporation)
• Original Assignee: ARKRAY, Inc, Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Inventors: Morita, Yoshimitsu, Shinno, Teppei
• Primary Examiner(s): NOGUEROLA, ALEXANDER STEPHAN
• Application Number:
  US10/496,209
• Publication Number:
  US 20050000829A1
• Time in Patent Office: 1,352 Days
• Field of Search: 20440301-40314, 204416-418, 204/401.R, 205/775, 2057775-778, 205/787, 205/789, 205/792, 422/50, 422/52, 422/58.1, 422 8201- 8203, 422 8204- 8213, 422/83
• US Class Current: 205/775
• CPC Class Codes: G01N 27/3274 Corrective measures, e.g. error detection, compensation for temperature or hematocrit, calibration coding of calibration information G01N33/48771

Abstract

An analyzer (A) includes a measurer (42) for measuring an electro-physical quantity of a sample, and an acceleration measurer (43) for computing the acceleration of change of the electro-physical quantity such as a current measured by the measurer (42). The fail determination as to whether or not a predetermined condition necessary for performing analysis of the sample is satisfied is made based on the acceleration computed by the acceleration measurer (43). As a result, the fail determination in the analysis process of the sample can be performed accurately.

Claims

1. A fail judging method to determine whether or not a predetermined condition necessary for performing analysis of a sample is satisfied by measuring an electro-physical quantity of the sample;

wherein the method comprises computing an acceleration of change of the electro-physical quantity and determining, based on the acceleration, whether or not a required amount of the sample necessary for performing the analysis is supplied.

2. The fail judging method according to claim 1, wherein the electro-physical quantity is a current that flows when a voltage is applied to the sample.

3. A fail judging method to determine whether or not a predetermined condition necessary for performing analysis of a sample is satisfied, the analysis comprising:

causing the sample to react with a predetermined reagent while applying a voltage to the sample and the reagent to cause a current to flow and computing a concentration of a particular component in the sample based on the current, wherein the method comprises;

computing an acceleration of change of the current at a time point at which the current reaches a predetermined value after the sample is introduced to the reagent layer; and

determining, based on the acceleration, whether or not a required amount of the sample necessary for performing the analysis is supplied.

4. The fail judging method according to claim 3, wherein the determination step comprises comparing the acceleration with a predetermined threshold value and determining that the required amount of the sample is not supplied when the acceleration is smaller than the threshold value.

5. An analyzer provided with a measurer for measuring an electro-physical quantity of a sample,

wherein the analyzer comprises:

an acceleration measurer configured for computing an acceleration of change of the electro-physical quantity; and

a determiner configured for determining, based on the acceleration computed by the acceleration measurer, whether or not a required amount of the sample necessary for performing analysis is supplied.

6. The analyzer according to claim 5, wherein the determination by the determiner is performed by comparing the acceleration with a predetermined threshold value.

7. The analyzer according to claim 5, further comprising a receptacle mount portion to which a receptacle for receiving the sample is removably mounted,

wherein the measurer measures an electro-physical quantity of the sample received by the receptacle mounted to the receptacle mount portion.

8. The analyzer according to claim 5, wherein the measurer comprises a current measuring circuit, and wherein the analyzer further comprises a processor for analyzing the sample based on current measured by the current measuring circuit.

9. The analyzer according to claim 8, wherein the acceleration measurer computes an acceleration of change of the current measured by the current measuring circuit.

10. The analyzer according to claim 9, wherein the acceleration measurer computes velocities at two time points at which the current changes and then computes an acceleration of the current change at an intermediate time point between the two time points based on a difference between the velocities of the current change at said two time points.

11. An analyzer comprising:

a mount portion for removably mounting a sensor including a reagent layer which effects a predetermined reaction with a sample introduced to the reagent layer, and a pair of electrodes for applying a voltage to the reagent layer;

a current measurer for measuring a current flowing between the electrodes when a voltage is applied across the electrodes; and

a processor for performing analysis of the sample based on the current measured by the current measurer;

wherein the analyzer further comprises an acceleration measurer configured for computing an acceleration of change of the current at a time point when the current reaches a predetermined value after the sample is introduced to the reagent layer; and

wherein the processor is configured to determine whether or not a required amount of the sample necessary for performing the analysis is supplied, the determination being made by comparing the acceleration computed by the acceleration measurer with a predetermined threshold value.