Capacitive measuring system

• US 7,098,673 B2
• Filed: 06/27/2002
• Issued: 08/29/2006
• Est. Priority Date: 06/28/2001
• Status: Expired due to Fees

• Current Assignee: Hitachi Computer Products (Europe) SAS (Hitachi, Ltd.)
• Original Assignee: Hitachi Computer Product Europe SAS (Hitachi, Ltd.)
• Inventors: Da Silva, Joaquim, Jordana, Pascal, Pancirol, William, Le Reste, Daniel, Launay, Claude, Parbaud, Philippe
• Primary Examiner(s): Benson, Walter
• Application Number:
  US10/482,611
• Publication Number:
  US 20050068043A1
• Time in Patent Office: 1,524 Days
• Field of Search: 324/658, 324/662, 324/690
• US Class Current: 324/658
• CPC Class Codes: G01D 5/24 by varying capacitance

Abstract

The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.

Claims

1. A measuring device comprising:

at least one measurement probe (10),

means (30) for sequentially applying a controlled supply voltage between the measurement probe (10) and a reference element (20);

means (50) for integrating the electrical charges accumulated on the measurement probe (10),

at least one auxiliary measurement probe (100) connected, also sequentially, to controlled power supply means (30) and to charge integration means (50), said auxiliary measurement probe (100) having, with respect to a potential detection region, a different capacitance from the main measurement probe (10), in such a way that it is possible, by comparing the signals emanating from the two measurement probes (10, 100) respectively, to determine the influence of the main measurement probe.

2. The device as claimed in claim 1, wherein the auxiliary measurement probe (100) has a controlled area that is small compared to the main measurement probe (10).

3. The device as claimed in claim 2, wherein the auxiliary measurement probe (100) lies at the same distance from the potential detection region, for example the upper surface of a seat, as the main measurement probe (10).

4. The device as claimed in claim 2 or claim 3, wherein the area and the location of the auxiliary measurement probe (100) are such that the latter always experiences the same external influence when a transient external phenomenon occurs, irrespective of the magnitude of this phenomenon.

5. The device as claimed in claim 2, wherein the area and the location of the main measurement probe (10) are such that the area of this main measurement probe (10) influenced by the transient external phenomenon depends on the magnitude of this phenomenon.

6. The device as claimed in claim 2, wherein the auxiliary measurement probe (100) is centered on the detection region.

7. The device as claimed in claim 2, wherein the auxiliary measurement probe (100) has a larger transverse dimension, of around a few centimeters.

8. The device as claimed in claim 7, wherein the transverse dimension is less than 1 cm.

9. The device as claimed in claim 2, wherein the auxiliary measurement probe (100) has a total area of less than a few square centimeters.

10. The device as claimed in claim 9, wherein the total area is less than 4 cm².

11. The device as claimed in claim 2, wherein the measuring device includes means for using the signal emanating from the integration of the charges accumulated on the auxiliary measurement probe (100) to determine the distance separating a body (P) from the auxiliary measurement probe (100) and then consequently to normalize the measurement obtained from the main probe (10).

12. The device as claimed in claim 1, wherein the auxiliary measurement probe (100) is located at a different distance from the potential detection region than the main measurement probe (10).

13. The device as claimed in claim 12, wherein the auxiliary measurement probe (100) has an area identical to that of the main measurement probe (10).

14. The device as claimed in claim 12, wherein the auxiliary measurement probe (100) has a different area from that of the main measurement probe (10), but in a known ratio relative to the latter.

15. The device as claimed in claim 12, 13 or 14, wherein the auxiliary measurement probe (100) is close to the main measurement probe (10), so that the difference in influence of an external body (P) on the respective two probes (10, 100) depends only on the difference in distance between the body (P) and these probes (10, 100).

16. The device as claimed in claim 12, wherein the measuring device includes means for combining the signals detected on the two measurement probes (10, 100) in order to determine the distance (e) between the main probe (10) and a body (P) to be detected and subsequently to factor out said distance in the measurement.

17. The device as claimed in claim 1, wherein the auxiliary measurement probe (100) and the main measurement probe (10) are asymmetric with respect to a reference element (110).

18. The device as claimed in claim 17, wherein the auxiliary measurement probe (100) is located at a different distance from a reference element (110) than the main measurement probe (10).

19. The device as claimed in claim 17 or claim 18, wherein it includes means for determining the distance (e) separating a body (F) to be detected from the measurement probes (10, 100) by combined use of the signals emanating from these two measurement probes (10, 100), for example by a ratio of the two capacitances measured on these two probes.

20. The device as claimed in claim 17, wherein the two, main (10) and auxiliary (100), measurement probes are coplanar with the reference element (110).

21. The device as claimed in claim 17, wherein the main (10) and auxiliary (100) measurement probes have identical, for example rectangular, areas.

22. The device as claimed in claim 17, wherein the reference element (110) has an area identical to the main (10) and auxiliary (100) measurement probes.

23. The device as claimed in claim 17, wherein the main (10) and auxiliary (100) measurement probes have different areas in a known ratio.

24. The device as claimed in claim 17, wherein when one of the two measurement probes (10, 100) is active, the other measurement probe (100, 10) itself serves as auxiliary reference element.

25. The device as claimed in claim 1, wherein the main measurement probe (10) has at least one dimension greater than the largest possible dimension of the body (P) that can be detected.

26. The device as claimed in claim 1, further comprising:

a probe (100) of U shaped configuration comprising two mutually parallel main strands (100, 204) placed respectively on either side of another probe (10).

27. The device as claimed in claim 1, further comprising:

at least one probe (10, 100) having a width that varies along its length.

28. The device as claimed in claim 27, further comprising:

at least one probe (10, 100) having three portions, namely a central portion (16, 106) and two end portions (18, 19;

108, 109).

29. The device as claimed in claim 27, further comprising:

at least one probe (10) having a central portion (16) of large width (116) and two end portions (18, 19) of small width (118, 119).

30. The device as claimed in claim 27, further comprising:

at least one probe (100) having a central portion (106) of small width (1106) and two end portions (108, 109) of large width (1108, 1109).

31. The device as claimed in claim 1, further comprising:

at least one nonrectilinear probe (10, 100, 110).

32. The device as claimed in claim 31, further comprising:

at least one probe (10, 100, 110) formed from various rectilinear segments joined together in pairs via their ends by transition elements of the concave dihedron type with alternating concavities.

33. The device as claimed in claim 1, further comprising:

a first set of two probes (10, 100) that are located at a defined distance from each other and a third probe (110) located at a greater distance from the two first mentioned probes (10, 100) than the gap that exists between said two probes.

34. The device as claimed in claim 23, further comprising:

means for sequentially applying a voltage between, on the one hand, the two first mentioned probes (10, 100) and, on the other hand, between the third probe (110) and each of the two first mentioned probes (10, 100), respectively.