Capacitive measuring system
First Claim
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1. A measuring device comprising:
- at least one measurement probe (10),means (30) for sequentially applying a controlled supply voltage between the measurement probe (10) and a reference element (20);
means (50) for integrating the electrical charges accumulated on the measurement probe (10),at least one auxiliary measurement probe (100) connected, also sequentially, to controlled power supply means (30) and to charge integration means (50), said auxiliary measurement probe (100) having, with respect to a potential detection region, a different capacitance from the main measurement probe (10), in such a way that it is possible, by comparing the signals emanating from the two measurement probes (10, 100) respectively, to determine the influence of the main measurement probe.
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Abstract
The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.
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Citations
34 Claims
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1. A measuring device comprising:
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at least one measurement probe (10), means (30) for sequentially applying a controlled supply voltage between the measurement probe (10) and a reference element (20); means (50) for integrating the electrical charges accumulated on the measurement probe (10), at least one auxiliary measurement probe (100) connected, also sequentially, to controlled power supply means (30) and to charge integration means (50), said auxiliary measurement probe (100) having, with respect to a potential detection region, a different capacitance from the main measurement probe (10), in such a way that it is possible, by comparing the signals emanating from the two measurement probes (10, 100) respectively, to determine the influence of the main measurement probe. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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Specification