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Method and apparatus for quantifying the quality of placement configurations in a partitioned region of an integrated circuit layout

  • US 7,100,137 B2
  • Filed: 12/19/2000
  • Issued: 08/29/2006
  • Est. Priority Date: 12/06/2000
  • Status: Expired due to Fees
First Claim
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1. For an electronic-design-automation placer that uses a set of partitioning lines, that define a plurality of slots, to partition an integrated-circuit (“

  • IC”

    ) layout region into a plurality of sub-regions corresponding to said slots, wherein a plurality of line paths exist between said slots, a method of pre-computing attributes that are used for placing circuit modules in an IC layout region, the method comprising;

    a) for each combination of said slots, identifying at least one connection graph that represents a topology of interconnect lines necessary for connecting the combination of said slots;

    b) for each combination of said slots, identifying the line paths used by the at least one connection graph for that particular combination of slots, wherein a plurality of the identified line paths are diagonal; and

    c) storing the plurality of identified line paths for each combination of slots in a storage structure, wherein said stored line paths are used by the placer to compute costs associated with different placements of said circuit modules.

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