Micro-electromechanical switch performance enhancement

• US 7,106,066 B2
• Filed: 08/28/2002
• Issued: 09/12/2006
• Est. Priority Date: 08/28/2002
• Status: Expired due to Fees

• Current Assignee: Teravicta Technologies Incorporated
• Original Assignee: Teravicta Technologies Incorporated
• Inventors: Ivanciw, Dan A., Hilbert, Claude
• Primary Examiner(s): Nguyen, Vincent Q.
• Application Number:
  US10/229,586
• Publication Number:
  US 20040040828A1
• Time in Patent Office: 1,476 Days
• Field of Search: 324/415, 363/33, 307/137
• US Class Current: 324/415
• CPC Class Codes: H01H 1/0015 Means for testing or for inspecting contacts, e.g. wear indicator measuring circuits G01R31/3274
• CPC Class Codes: H01H 1/60 Auxiliary means structurally associated with the switch for cleaning or lubricating contact-making surfaces cleaning by normal sliding of contacts H01H1/18, H01H1/36
• CPC Class Codes: H01H 1/605 Cleaning of contact-making surfaces by relatively high voltage pulses
• CPC Class Codes: H01H 11/0062 Testing or measuring non-electrical properties of switches, e.g. contact velocity monitoring contacts H01H1/0015; monitoring gas density H01H33/563; monitoring vacuum H01H33/668; calibrating H01H69/01; adjusting H01H71/74; testing of electrical properties G01R31/333
• CPC Class Codes: H01H 2059/0063 with stepped actuation, e.g. actuation voltages applied to different sets of electrodes at different times or different spring constants during actuation
• CPC Class Codes: H01H 47/04 for holding armature in attracted position, e.g. when initial energising circuit is interrupted; for maintaining armature in attracted position, e.g. with reduced energising current with switching regulator H01H47/325
• CPC Class Codes: H01H 59/0009 making use of micromechanics

Abstract

In methods and circuits for using associated circuitry to enhance performance of a micro-electromechanical switch, one of the method embodiments is a contact conditioning process including applying a time-varying voltage to the control element of a closed switch. In another embodiment, a voltage profile applied to the control element of the switch can be tailored to improve the actuation speed or reliability of the switch. In another method embodiment, the performance of a switch may be evaluated by measuring a performance parameter, and corrective action initiated if the switch performance is determined to need improvement. An embodiment of a circuit for maintaining performance of a micro-electromechanical switch includes first and second signal line nodes, sensing circuitry coupled to the signal line nodes and adapted to sense a performance parameter value of the switch, and control circuitry operably coupled to at least one terminal of the switch.

Claims

1. A method of maintaining performance of a micro-electromechanical switch, said method comprising:

measuring a performance parameter of the switch; and

upon detecting switch performance below a predetermined lever settable by the user of the switch, initiating corrective action by applying at least one of;

a time-varying voltage configured to induce a scrubbing action between contacts of the switch; and

a modified control voltage profile for operating the switch, wherein the modified control voltage profile comprises at least of;

a different shaped profile; and

an off voltage applied at a different magnitude.

2. The method of claim 1, wherein the performance parameter comprises a resistance of the switch when closed.

3. The method of claim 1, wherein the performance parameter comprises a capacitance of the switch when open, a control voltage needed to close the switch, or a time needed for opening or closing of the switch.

4. The method of claim 1, wherein the performance parameter comprises a cumulative number of open/close cycles performed by the switch.

5. The method of claim 1, wherein said measuring is repeated periodically.

6. A circuit for maintaining performance of a micro-electromechanical switch, said circuit comprising:

first and second signal line nodes, operably coupled to first and second signal lines, respectively, wherein the first and second signal lines are coupled together when the switch is closed;

sensing circuitry operably coupled to at least one terminal of the switch and adapted to sense a performance parameter value of the switch;

a control node coupled to the sensing circuitry and operably coupled to a control element of the switch; and

control circuitry coupled to the control node and operably coupled to the at least one terminal of the switch, wherein the control circuitry is a adapted to evaluate the sensed performance parameter value and initiate corrective action upon detecting switch performance below a predetermined level, wherein, the corrective action comprises applying a varying control voltage to the control element to achieve a scrubbing action between contact elements of the switch.

7. The circuit of claim 6, wherein the performance parameter comprises a resistance or a capacitance between the any two terminals of the switch.

8. The circuit of claim 6, wherein the performance parameter comprises a control element voltage required to close the switch or a time required to open or close the switch.

9. The circuit of claim 6, wherein the control circuitry is adapted to compare the sensed performance parometer value with a stored thresphold parameter value.

10. The circuit of claim 6, wherein the corrective action comprises applying to the control element a modified control voltage sequence. scrubbing action.

11. The circuit of claim 6, further comprising voltage translation circuitry operably coupled between the control circuitry and the control element of the switch, wherein the voltage translation circuitry is adapted to convert voltages output by the control circuitry to relatively higher voltages needed to actuate the switch.

12. The circuit of claim 6, further comprising electrostatic discharge protection circuitry coupled between the control element of the switch and an externally-accessible terminal of the switch.

13. The circuit of claim 6, wherein the circuit forms at least a portion of an integrated circuit.

14. A circuit for maintaining performance of a micro-electromechanical switch, said ciruit comprising:

first and second signal line nodes, operably coupled to first and second signal lines, respectively, wherein the first and second signal lines are coupled together when the switch is closed;

sensing cirucitry operably coupled to at least one terminal of the switch and adapted to sense a performance parameter value of the switch;

a control node coupled to the sensing cirucitry and operably coupled to a control element of the switch; and

control circuitry coupled to the control node and operably coupled to the at least one terminal of the switch, wherein the control circuitry is adapted to evaluate the sensed performance parameter value and initiate corrective action upon detecting switch performance below a predetermined level, wherein the corrective action comprises applying to the control element a modified control voltage sequence comprising at least one of;

a different shaped profile; and

an off voltage applied at a different magnitude.

15. The circuit of claim 14, wherein the corrective action further comprises applying a varying control voltage to the control element to achieve a scrubbing action between contact elements of the switch.

16. The circuit of claim 15, wherein the performance parameter comprises a resistance of the switch when closed.

17. The circuit of claim 15, wherein the performance parameter comprises a capacitance of the switch when open.

18. The circuit of claim 15, wherein the performance parameter comprises a control voltage needed to close the switch, or a time needed for opening or closing of the switch.

19. The circuit of claim 15, wherein the performance parameter comprises a time needed for opening or closing the switch.

20. The circuit of claim 15, wherein the performance parameter comprises a cumulative number of open/close cycles performed by the switch.