Integrated galvanomagnetic sensor array system

• US 7,106,233 B2
• Filed: 01/30/2003
• Issued: 09/12/2006
• Est. Priority Date: 01/30/2003
• Status: Expired due to Fees

• Current Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Original Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Inventors: Schroeder, Thaddeus, Guerra, Jose Alberto
• Primary Examiner(s): Barnie, Rexford
• Assistant Examiner(s): Lauture, Joseph
• Application Number:
  US10/354,294
• Publication Number:
  US 20040150385A1
• Time in Patent Office: 1,321 Days
• Field of Search: 341/141, 738/623.33, 338/32.H, 338/32.R, 324/207.21, 324/117.H, 324/127, 324/71.3, 324/207.2, 324/454, 324/207
• US Class Current: 341/141
• CPC Class Codes: G01R 33/07 Hall effect devices

Abstract

Galvanomagnetic sensor array system and method for providing data interface to a basic sensor array are provided. The sensor system includes an array of galvanomagnetic elements, and a processor coupled to receive each output signal from the array of galvanomagnetic elements. The processor and array of galvanomagnetic elements are integrated in a single semiconductor die.

Claims

1. A galvanomagnetic sensor array system comprising:

an array of galvanomagnetic elements, wherein at least three galvanomagnetic elements make up the array; and

a processor coupled to receive each output signal from the array of galvanomagnetic elements, wherein the processor and array of galvanomagnetic elements are integrated in a single semiconductor die;

a differential amplifier coupled to receive at a first terminal thereof a signal constituting the output signal from any selected one of the galvanomagnetic elements, the amplifier further coupled to receive at a second terminal thereof an offset signal selectable to remove bias that may be present in the output signal of the selected galvanomagnetic element.

2. The galvanomagnetic sensor array system of claim 1 wherein the amplifier is configured to provide variable gain amplification to the output signal from the selected galvanomagnetic element in response to a gain control signal from the processor.

3. The galvanomagnetic sensor array system of claim 2 further comprising an analogue-to-digital converter coupled to the amplifier to receive an amplified signal from the amplifier, wherein the gain imparted by the amplifier is selected to match the dynamic range of the sensor array relative to the range of the converter.

4. The galvanomagnetic sensor array system of claim 1 further comprising a multiplexer configured to select the output signal to be coupled to the amplifier in response to a sensor select signal from the processor.

5. A method for providing data interface between a galvanomagnetic sensor array integrated in a semiconductor die and an externally connected processor, the method comprising:

providing a pin in the die for passing to the externally connected processor a scan of samples from each galvanomagnetic element of the sensor array; and

configuring each scan of samples to uniquely associate each scan sample with a respective element of the sensor array wherein the configuring of each scan of samples comprises;

providing a variable time interval between any two successive samples, wherein the duration of the variable time interval is selected to uniquely identify the sensor element associated with the last sample of the two successive samples; and

uniquely identifying the sensor element associated with the last sample of any two successive samples based on the time interval measured between the two successive samples.

6. A method for providing data interface between a galvanomagnetic sensor array integrated in a semiconductor die and an externally connected processor, the method comprising:

providing a pin in the die for passing to the externally connected processor a scan of samples from each galvanomagnetic element of the sensor array; and

configuring each scan of samples to uniquely associate each scan sample with a respective element of the sensor array wherein the configuring of each scan of samples comprises;

providing a sample sequence uniquely indicative of each sensor element associated with each sample within a scan, the sample sequence recurring for each new scan;

assigning a time interval indicative of completion of a scan of samples, the assigned time interval being sufficiently distinct relative to the time interval between samples within each scan; and

identifying each sensor element associated with each sample within each new scan based on the recurring sample sequence for each new scan of samples.

7. A galvanomagnetic sensor array comprising:

an array of galvanomagnetic elements in a single semiconductor die, wherein the array contains at least three galvanomagnetic elements; and

interface structure constructed in the die for providing data interface between the galvanomagnetic sensor array and an externally connected processor, the interface structure comprising;

a pin for passing to the externally connected processor a scan of samples from each galvanomagnetic element of the sensor array, wherein each scan of samples is processed by the externally connected processor to uniquely associate each scan sample with a respective element of the sensor array wherein the externally connected processor comprises;

a module for providing a variable time interval between any two successive samples, wherein the duration of the variable time interval is selected to uniquely identify the sensor element associated with the last sample of the two successive samples; and

a module for uniquely identifying the sensor element associated with the last sample of any two successive samples based on the time interval measured between the two successive samples.

8. A galvanomagnetic sensor array comprising:

an array of galvanomagnetic elements in a single semiconductor die, wherein the array contains at least three galvanomagnetic elements; and

interface structure constructed in the die for providing data interface between the galvanomagnetic sensor array and an externally connected processor, the interface structure comprising;

a pin for passing to the externally connected processor a scan of samples from each galvanomagnetic element of the sensor array, wherein each scan of samples is processed by the externally connected processor to uniquely associate each scan sample with a respective element of the sensor array;

wherein the externally connected processor comprises;

a module for providing a sample sequence uniquely indicative of each sensor element associated with each sample within a scan, the sample sequence recurring for each new scan;

a module for assigning a time interval indicative of completion of a scan of samples, the assigned time interval being sufficiently distinct relative to the time interval between samples within each scan; and

a module for identifying each sensor element associated with each sample within each new scan based on the recurring sample sequence for each new scan of samples.