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Pixel defect detector for solid-state imaging device

  • US 7,106,371 B1
  • Filed: 09/08/1999
  • Issued: 09/12/2006
  • Est. Priority Date: 09/08/1998
  • Status: Expired due to Fees
First Claim
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1. A pixel defect detector for a solid-state imaging device comprising a plurality of photoelectric transducers, the pixel defect detector comprising:

  • a calculation section for obtaining output characteristics of a subject photoelectric transducer for at least three amounts of light incident thereupon so as to determine the presence/absence of a defect in the subject photoelectric transducer based on the output characteristics thereof, whereinan output corresponding to a non-defective photoelectric transducer is calculated based on outputs from a plurality of photoelectric transducers neighboring the subject photoelectric transducer for at least one of the amounts of incident light without requiring specific amounts of incident light, andthe calculated output corresponding to a non-defective transducer is used in determining the presence/absence of a defect in the subject photoelectric transducer.

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