Universal spatial pattern recognition system
First Claim
1. A system for analyzing patterns in semiconductor wafers, comprising:
- a spatial pattern recognition engine operable to receive a first set of data corresponding to a pattern on a semiconductor wafer and to generate a normalized contour representation of said first data set;
a common pattern data reference library containing a plurality of reference contour data sets;
a pattern analyzer operable to compare said normalized data set to said plurality of reference contour data sets and to generate a correlation label associating said first data set with one of said plurality of reference contour data sets; and
a pixel grid generator for converting said first data set into a plurality of virtual pixels.
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Abstract
A method and apparatus for analyzing patterns in semiconductor wafers wherein the patterns are compared to a plurality of patterns stored in a common pattern library. A spatial pattern recognition engine is operable to receive a first set of data corresponding to a pattern on a semiconductor wafer and to generate a normalized contour representation of said first data set. A pattern analyzer compares the normalized data set to a plurality of reference contour data sets stored in a common pattern data reference library and generates a correlation label associating the first data set with one of the plurality of reference contour data sets. The label associated with the first data set is stored in a label storage database that can be accessed to perform subsequent analysis on the data associated with a specific wafer. The system can be used to analyze multiple types of patterns, including defect data, bin data, positional parameter data and in-line site data.
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Citations
25 Claims
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1. A system for analyzing patterns in semiconductor wafers, comprising:
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a spatial pattern recognition engine operable to receive a first set of data corresponding to a pattern on a semiconductor wafer and to generate a normalized contour representation of said first data set; a common pattern data reference library containing a plurality of reference contour data sets; a pattern analyzer operable to compare said normalized data set to said plurality of reference contour data sets and to generate a correlation label associating said first data set with one of said plurality of reference contour data sets; and a pixel grid generator for converting said first data set into a plurality of virtual pixels. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system for analyzing patterns in semiconductor wafers, comprising:
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a plurality of process sensors for providing status data relating to the status of a semiconductor wafer process; a fault detector for receiving said status data and for generating a fault signal and for associating said fault signal with a first data set representing a wafer pattern; a spatial pattern recognition engine for generating a normalized contour representation of said data set; a common pattern data reference library containing a plurality of reference contour data sets; and a pattern analyzer operable to compare said normalized data set to said plurality of reference contour data sets and to generate a correlation label associating said first data set with one of said plurality of reference contour data sets; and a pixel grid generator operable to convert said first data set into a plurality of virtual pixels. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A method for analyzing patterns in semiconductor wafers, comprising:
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obtaining a first data set corresponding to a pattern on a wafer, said first data set being in a first format; converting said first data set in said first format to a second format comprising a normalized contour data representation of said first data set; comparing said normalized contour data representation to a plurality of reference contour patterns in a common pattern reference library; and generating a correlation label associating said normalized data set with one of said plurality of reference contour data sets; and a using a pixel grid generator to convert said first data set into a plurality of virtual pixels. - View Dependent Claims (20, 21, 22, 23, 24, 25)
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Specification