Manufacturing system, measurement data collecting system, and measurement terminal apparatus

• US 7,107,114 B2
• Filed: 04/25/2005
• Issued: 09/12/2006
• Est. Priority Date: 03/18/2002
• Status: Expired due to Fees

• Current Assignee: Seiko Epson Corporation (Seiko Group)
• Original Assignee: Seiko Epson Corporation (Seiko Group)
• Inventors: Yoshida, Yoshifumi, Kojima, Koichi, Torii, Hideo, Harai, Atsushi, Ichikawa, Yuya
• Primary Examiner(s): Picard, Leo
• Assistant Examiner(s): Masinick, Michael D.
• Application Number:
  US11/113,910
• Publication Number:
  US 20050192695A1
• Time in Patent Office: 505 Days
• Field of Search: 700/108, 700/110, 700/121, 702/85
• US Class Current: 700/108
• CPC Class Codes: G06Q 10/00 Administration; Management

Abstract

A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulate as inspection data and exchanged among the steps.

Claims

1. A measurement data collecting system comprising:

a plurality of processors connected by a communication line, each processor having at least one program selected from;

a program for implementing a function for turning an instruction for carrying out measurement into data and processing the data;

a program for implementing a function for carrying out management based on the instruction and turning a measurement result obtained by the measurement into data and processing the data;

a program for implementing a function for displaying the status of the measurement on display, based on the measurement result;

a program for implementing a function for displaying the measurement result on a display;

a program for implementing a function for outputting the measurement result; and

a program for implementing a function for registering a measuring instrument used for the measurement,

wherein the plurality of processors execute the program for each function as a whole.

2. The measurement data collecting system according to claim 1 further comprising:

an accumulating apparatus that exchanges data used for aiding measurement and data regarding measurement results obtained by the measurement with the processor, the accumulating apparatus being connected by the communication line.

3. The measurement data collecting system according to claim 1, wherein

a processor having the program for implementing a function for turning a measurement result obtained by measurement into data and processing the data further comprises:

interfacing means for converting a signal sent by one of a measuring instrument and the processor into a signal that can be processed by the other of the measuring instrument and the processor.

4. The measurement data collecting system according to claim 1, wherein

a processor having the program for implementing a function for turning a measurement result obtained by measurement into data and processing the data further comprises:

a measuring instrument interface that processes a signal including a measurement result as data according to at least one of the type of measurement and a measuring instrument and turns the signal into data of a common format.