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Membrane probing system with local contact scrub

  • US 7,109,731 B2
  • Filed: 06/17/2005
  • Issued: 09/19/2006
  • Est. Priority Date: 08/08/1996
  • Status: Expired due to Fees
First Claim
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1. A probing assembly for probing an electrical device comprising:

  • (a) a forward support of incompressible material;

    (b) a flexible membrane assembly having a central region positioned in overlying relationship to said forward support;

    (c) a plurality of rigid contacts disposed on said central region each including a beam and a contacting portion, each contacting portion being arranged in suitable position for pressing engagement with a corresponding pad on said device, each beam being electrically connected to a corresponding flexible conductor that extends into said central region;

    (d) a pressure control mechanism including an elastomeric member interposed between each contact and said support; and

    (e) a motion control mechanism locally operating in respect to each contact to urge each beam, when the corresponding contacting portion is placed into pressing engagement with the respective pad, into tilting motion so that different portions of each beam move different distances relative to said forward support and so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across the corresponding pad, said elastomeric member being positioned so as to enable each beam to recover from said tilting motion in a manner avoiding mechanical straining of each beam.

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