Leakage-tolerant dynamic wide-NOR circuit structure
First Claim
1. A circuit which blocks a keeper from interfering with a dynamic node during an evaluation phase for a dynamic wide-NOR structure, comprising:
- a precharge device which is coupled to the dynamic node, wherein the precharge device precharges the dynamic node during a precharge phase;
a plurality of parallel pull-down transistors which are coupled to the dynamic node, wherein the pull-down transistors conditionally discharge the dynamic node during the evaluate phase;
the keeper, which is configured to sustain a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through the parallel pull-down transistors; and
a feedback gating device which is coupled between the keeper and the dynamic node;
a narrow pulse generator which generates a feedback control signal that controls the feedback gating device, wherein the feedback control signal is active for a predetermined time which is shorter than the active phase of an input to the narrow pulse generator; and
wherein during the evaluation phase the feedback gating device blocks the keeper, so that the parallel pull-down transistors can discharge the dynamic node without interference from the keeper.
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Accused Products
Abstract
One embodiment of the present invention provides a circuit which blocks a keeper from interfering with a dynamic node during an evaluation phase for a dynamic wide-NOR structure. The circuit contains a precharge device which is coupled to the dynamic node. The precharge device precharges the dynamic node during a precharge phase. The circuit also contains a plurality of parallel pull-down transistors which are coupled to the dynamic node. The pull-down transistors conditionally discharge the dynamic node during the evaluate phase. The keeper sustains a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through the parallel pull-down transistors. In addition, the circuit contains a feedback gating device which is coupled between the keeper and the dynamic node. During the evaluation phase, the feedback gating device blocks the keeper, so that the parallel pull-down transistors can discharge the dynamic node without interference from the keeper.
38 Citations
21 Claims
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1. A circuit which blocks a keeper from interfering with a dynamic node during an evaluation phase for a dynamic wide-NOR structure, comprising:
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a precharge device which is coupled to the dynamic node, wherein the precharge device precharges the dynamic node during a precharge phase; a plurality of parallel pull-down transistors which are coupled to the dynamic node, wherein the pull-down transistors conditionally discharge the dynamic node during the evaluate phase; the keeper, which is configured to sustain a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through the parallel pull-down transistors; and a feedback gating device which is coupled between the keeper and the dynamic node; a narrow pulse generator which generates a feedback control signal that controls the feedback gating device, wherein the feedback control signal is active for a predetermined time which is shorter than the active phase of an input to the narrow pulse generator; and wherein during the evaluation phase the feedback gating device blocks the keeper, so that the parallel pull-down transistors can discharge the dynamic node without interference from the keeper. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for blocking a keeper from interfering with a dynamic node during an evaluate phase for a dynamic wide-NOR structure, comprising:
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when a feedback gating device is activated, causing the keeper to sustain a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through a group of inactive pull-down transistors during the evaluate phase; precharging the dynamic node during a precharge phase; and upon leaving the precharge phase and entering the evaluate phase, using a narrow pulse generator to generate a feedback control signal for the feedback gating device, wherein the feedback control signal is active for a predetermined time which is shorter than the active phase of an input to the narrow pulse generator; deactivating the feedback gating device, thereby preventing the keeper from sustaining the precharged value on the dynamic node, and conditionally discharging the dynamic node without interference from the keeper. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A computer system, comprising:
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a processor; a memory; a dynamic wide-NOR structure which blocks a keeper from interfering with a dynamic node during an evaluation phase; a precharge device which is coupled to the dynamic node, wherein the precharge device precharges the dynamic node during a precharge phase; the keeper, which is configured to sustain a precharged value on the dynamic node, thereby preventing a false evaluation caused by a leakage current through the parallel pull-down transistors; a plurality of parallel pull-down transistors which are coupled to the dynamic node, wherein the pull-down transistors conditionally discharge the dynamic node during the evaluate phase; and a feedback gating device which is coupled between the keeper and the dynamic node; a narrow pulse generator which generates a feedback control signal that controls the feedback gating device, wherein the feedback control signal is active for a predetermined time which is shorter than the active phase of an input to the narrow pulse generator; and wherein during the evaluation phase the feedback gating device blocks the keeper, so that the parallel pull-down transistors can discharge the dynamic node without interference from the keeper. - View Dependent Claims (16, 17, 18, 19, 20, 21)
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Specification