Inspection system, inspection method, and method for manufacturing semiconductor device
First Claim
1. A method for manufacturing a semiconductor device comprising:
- forming a plurality of TFTs over a substrate;
forming an antenna in an upper portion of the TFT;
forming an interlayer insulating film over the antenna;
forming a plurality of chips by forming a protective layer over the interlayer insulating film to cover the antenna;
supplying a signal or power supply voltage to each of the plurality of chips without contact with each antenna of the plurality of chips;
moving an inspection electrode with an arbitrary portion of the antenna or the whole antenna of each of the plurality of chips overlapped with the inspection electrode with a space therebetween;
conducting an inspection for grasping an operating state of each of the plurality of chips from a voltage of the inspection electrode and a position of the inspection electrode to the plurality of chips;
separating the substrate of the chips that have been inspected from the TFT and an antenna; and
attaching the TFT and the antenna that have been separated to a support medium.
1 Assignment
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Accused Products
Abstract
The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process and an inspection method using the inspection system. The inspection system according to the present invention includes a plurality of inspection electrodes, a plurality of inspection antennas, a position control unit, a unit for applying voltage to each of the inspection antennas, and a unit for measuring potentials of the inspection electrodes. One feature of the inspection system is that a plurality of ID chips and the plurality of inspection electrodes are overlapped with a certain space therebetween, and the plurality of ID chips and the plurality of inspection antennas are overlapped with a certain space therebetween, and the plurality of ID chips are interposed between the plurality of inspection electrodes and the plurality of inspection antennas by the position control unit.
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Citations
12 Claims
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1. A method for manufacturing a semiconductor device comprising:
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forming a plurality of TFTs over a substrate; forming an antenna in an upper portion of the TFT; forming an interlayer insulating film over the antenna; forming a plurality of chips by forming a protective layer over the interlayer insulating film to cover the antenna; supplying a signal or power supply voltage to each of the plurality of chips without contact with each antenna of the plurality of chips; moving an inspection electrode with an arbitrary portion of the antenna or the whole antenna of each of the plurality of chips overlapped with the inspection electrode with a space therebetween; conducting an inspection for grasping an operating state of each of the plurality of chips from a voltage of the inspection electrode and a position of the inspection electrode to the plurality of chips; separating the substrate of the chips that have been inspected from the TFT and an antenna; and attaching the TFT and the antenna that have been separated to a support medium. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for manufacturing a semiconductor device comprising:
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forming a plurality of TFTs over a substrate; forming an antenna in an upper portion of the TFT; forming an interlayer insulating film over the antenna; forming a plurality of chips by forming a protective layer over the interlayer insulating film to cover the antenna; supplying a signal or power supply voltage to each of the plurality of chips without contact by overlapping each antenna of the plurality of chips with an inspection electrode with a space therebetween; moving the inspection electrode with an arbitrary portion of the antenna or the whole antenna of each of the plurality of chips overlapped with the inspection electrode with a space therebetween; conducting an inspection for grasping an operating state of each of the plurality of chips from a voltage of the inspection electrode and a position of the inspection electrode to the plurality of chips; separating the substrate of the chips that have been inspected from the TFT and an antenna; and attaching the TFT and the antenna that have been separated to a support medium. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification