Multiplexing rotary spectrometer

• US 7,113,282 B2
• Filed: 12/19/2003
• Issued: 09/26/2006
• Est. Priority Date: 12/19/2003
• Status: Expired due to Fees

• Current Assignee: 3M Innovative Properties Company (3M Company)
• Original Assignee: 3M Innovative Properties Company (3M Company)
• Inventors: Lai, Jack W., Aguirre, Francis M.
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US10/741,237
• Publication Number:
  US 20050134854A1
• Time in Patent Office: 1,012 Days
• Field of Search: 356/414, 356/418, 356/419
• US Class Current: 356/418
• CPC Class Codes: G01J 1/20 intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
• CPC Class Codes: G01J 3/0213 using attenuators
• CPC Class Codes: G01J 3/51 using colour filters
• CPC Class Codes: G01J 3/513 having fixed filter-detector pairs
• CPC Class Codes: G01N 2021/3133 with selection of wavelengths before the sample
• CPC Class Codes: G01N 2021/3159 Special features of multiplexing circuits
• CPC Class Codes: G01N 2021/3166 using separate detectors and filters
• CPC Class Codes: G01N 2021/3174 Filter wheel
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence

Abstract

A rotary spectrometer including a plurality of input ports. Each input port may be arranged to receive an optical waveguide carrying electromagnetic radiation. The spectrometer also includes a plurality of optical bandpass filters, which are housed on a first body that rotates under the control of a motor so that each optical bandpass filter may be brought into alignment with each input port. Further, the spectrometer includes a plurality of detector circuits disposed on a second body that rotates with the first body. Each detector circuit is optoelectrically coupled to one of the plurality of optical bandpass filters, thereby resulting in each detector circuit being dedicated to responding to a range of wavelengths determined by the bandpass filter to which it is optoelectrically coupled.

Claims

1. A spectrometer comprising:

a plurality of optical bandpass filters housed on a first body that is moveable relative to at least one other member of the spectrometer;

a plurality of detector circuits;

wherein, each detector circuit is permanently optoelectrically coupled to a single optical bandpass filter.

2. The spectrometer of claim 1, wherein the first body is rotatable, and wherein the plurality of detector circuits is disposed on a second body that rotates with the first body.

3. The spectrometer of claim 2, wherein the first body and second body are rigidly coupled to one another.

4. The spectrometer of claim 1, wherein the spectrometer further comprises:

a computer operably coupled to each of the detector circuits.

5. The spectrometer of claim 2, wherein the spectrometer further comprises:

a computer operably coupled to each of the detector circuits.

6. The spectrometer of claim 5, wherein the detector circuits and computer are operably coupled via a plurality of electrical paths, each path passing through a slip ring interposed between the detector circuits and the computer.

7. The spectrometer of claim 1, wherein the spectrometer further comprises:

a plurality of photoelectric elements, each photoelectric element being interposed between one of the plurality of optical bandpass filters and one of the plurality of detector circuits, wherein each of the photoelectric elements is arranged to receive electromagnetic radiation and produce an electrical signal in approximate proportion to the intensity of the received electromagnetic radiation.

8. The spectrometer of claim 7, wherein each photoelectric element is permanently optically coupled to a single optical bandpass filter and permanently electrically coupled to a single detector circuit.

9. The spectrometer of claim 8, wherein the first body is rotatable, and wherein each photoelectric element is disposed on a second body that rotates with the first body.

10. The spectrometer of claim 9, wherein the plurality of detector circuits are disposed on the second body.

11. The spectrometer of claim 9, wherein the first body and the second body are rigidly coupled to one another.

12. The spectrometer of claim 9, wherein the photoelectric elements and the detector circuits are operably coupled via a plurality of electrical paths, each path passing through a slip ring interposed between the photoelectric elements and the detector circuits.

13. A spectrometer comprising:

a plurality of input ports, each input port arranged to receive an optical waveguide carrying electromagnetic radiation;

a plurality of optical bandpass filters, the filters being housed on moveable first body arranged such that each optical bandpass filter may be brought into alignment with each input port; and

a plurality of detector circuits disposed on a second body that moves with the first body;

wherein each detector circuit is optoelectrically coupled to one of the plurality of optical bandpass filters, thereby resulting in each detector circuit being dedicated to responding to a range of wavelengths determined by the bandpass filter to which it is optoelectrically coupled.

14. The spectrometer of claim 13, wherein:

each detector circuit has a controllable gain factor.

15. The spectrometer of claim 14, wherein:

each detector circuit has a course gain control and a fine gain control.

16. The spectrometer of claim 13, wherein:

each detector circuit has an offset factor for compensating for dark current.

17. The spectrometer of claim 13, wherein:

the second body is rigidly coupled to the first body.

18. The spectrometer of claim 13, wherein the spectrometer further comprises:

a computer operably coupled to each of the detector circuits.

19. The spectrometer of claim 18, wherein the detector circuits and computer are operably coupled via a plurality of electrical paths, each path passing through a slip ring interposed between the detector circuits and the computer.

20. The spectrometer of claim 19, wherein the slip ring is rigidly coupled to the second body.

21. The spectrometer of claim 20, electrical power is supplied to the detector circuits via electrical paths passing through the slip ring and extending to the detector circuits.

22. The spectrometer of claim 13, wherein the input ports comprise apertures extending from one face of a plate to an opposite face.

23. The spectrometer of claim 13, wherein the first body comprises a circular plate.

24. The spectrometer of claim 23, wherein the circular plate contains a plurality of apertures extending from one face of the plate to the other, and wherein the apertures are dimensioned to house the optical bandpass filters.

25. A method of selecting a gain factor of a detector circuit in a spectrometer, wherein the spectrometer comprises a plurality of input ports, a plurality of optical bandpass filters, and a plurality of the detector circuits, each input port being arranged to receive an optical waveguide carrying electromagnetic radiation, each optical bandpass filter being movable so that it may be brought into alignment with any given input port, each of the detector circuits being optoelectrically coupled to one optical bandpass filters, the method comprising:

supplying electromagnetic radiation from a source, along one of the optical waveguides, to one of the optical bandpass filters;

receiving, with a photoelectric element, electromagnetic radiation that has passed through the one optical bandpass filter and creating an electric signal having an amplitude approximately in proportion to intensity of the electromagnetic radiation impinging upon the photoelectric element;

supplying the electric signal to the detector circuit that is coupled to the one optical bandpass filter, thereby creating a detector output signal in approximate proportion to the electric signal; and

adjusting the gain factor of the detector circuit that is coupled to the one optical bandpass filter without having moved the one optical bandpass filter so as to bring it into alignment with another of the optical waveguides.

26. The method of claim 25, wherein the source of electromagnetic radiation has a selectable output level and wherein the output level is selected to a maximum level.

27. The method of claim 26, wherein the gain factor is adjusted by selecting the gain factor so as to bring the detector output signal to a specified voltage level.

28. The method of claim 25, wherein the gain factor is adjusted by selecting the gain factor so as to bring the detector output signal to a specified voltage level.

29. The method of claim 28, wherein the specified voltage level is approximately eighty percent of a maximum output voltage of the detector circuit that is coupled to the one optical bandpass filter.

30. The method of claim 25, wherein each of the optical waveguides directs electromagnetic radiation from a separate source of electromagnetic radiation.

31. The method of claim 30, wherein each of the separate sources of electromagnetic radiation exhibits substantially similar wavelength intensity characteristics.

32. The method of claim 25, wherein each of the optical waveguides directs electromagnetic radiation from the same source of electromagnetic radiation.

33. The method of claim 25, wherein a first and a second of the optical waveguides directs electromagnetic radiation from a first source of electromagnetic radiation and a third optical waveguide directs electromagnetic radiation from a second source of electromagnetic radiation.

34. A method of manufacturing an article that is exposed to electromagnetic radiation during at least one phase of manufacture, the method comprising:

bringing a substance in a first state to a source of electromagnetic radiation;

exposing the substance to the electromagnetic radiation, whereby the substance is caused to transition to a second state; and

monitoring the source of electromagnetic radiation with a spectrometer having a plurality of optical bandpass filters housed on a first body that rotates under the control of a motor and a plurality of detector circuits, wherein each detector circuit is permanently optoelectrically coupled to a single optical bandpass filter.

35. The method of claim 34, wherein the plurality of detector circuits is disposed on a second body that rotates with the first body.

36. The method of claim 35, wherein the first body and second body are rigidly coupled to one another.

37. The method of claim 34, wherein the spectrometer further comprises:

a computer operably coupled to each of the detector circuits.

38. The method of claim 35, wherein the spectrometer further comprises:

a computer operably coupled to each of the detector circuits.

39. The method of claim 38, wherein the detector circuits and computer are operably coupled via a plurality of electrical paths, each path passing through a slip ring interposed between the detector circuits and the computer.

40. The method of claim 34, wherein the spectrometer further comprises:

a plurality of photoelectric elements, each photoelectric element being interposed between one of the plurality of optical bandpass filters and one of the plurality of detector circuits, wherein each of the photoelectric elements is arranged to receive electromagnetic radiation and produce an electrical signal in approximate proportion to the intensity of the received electromagnetic radiation.

41. The method of claim 40, wherein each photoelectric element is permanently optically coupled to a single optical bandpass filter and permanently electrically coupled to a single detector circuit.

42. The method of claim 41, wherein each photoelectric element is disposed on a second body that rotates with the first body.

43. The method of claim 42, wherein the plurality of detector circuits are disposed on the second body.

44. The method of claim 42, wherein the first body and the second body are rigidly coupled to one another.