Semiconductor manufacturing using optical ablation
First Claim
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1. A method of removing material from a surface of a semiconductor wafer comprising the steps of:
- generating an initial wavelength-swept-with-time optical pulse in an optical pulse generator;
amplifying the initial pulse;
compressing the amplified pulse to a duration of less than about 10 picoseconds, to generate a compressed optical pulse; and
applying the compressed optical pulse to the wafer surface, to remove material from the wafer surface;
wherein the step of amplifying is done with a fiber-amplifier and the step of compressing is done with an air-path between gratings compressor, and the initial wavelength-swept-with-time optical pulses is between about 10 picoseconds and about 3 nanoseconds and the compressed optical pulse has a sub-picosecond duration and an energy density on the surface is between about 2 and about 10 times an optical ablation threshold of the surface.
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Abstract
The present invention relates to methods and systems for ablation based material removal configuration for use in semiconductor manufacturing that includes the steps of generating an initial wavelength-swept-with-time optical pulse in an optical pulse generator, amplifying the initial pulse, compressing the amplified pulse to a duration of less than about 10 picoseconds and applying the compressed optical pulse to the wafer surface, to remove material from, e.g., wafer surface.
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Citations
19 Claims
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1. A method of removing material from a surface of a semiconductor wafer comprising the steps of:
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generating an initial wavelength-swept-with-time optical pulse in an optical pulse generator; amplifying the initial pulse; compressing the amplified pulse to a duration of less than about 10 picoseconds, to generate a compressed optical pulse; and applying the compressed optical pulse to the wafer surface, to remove material from the wafer surface; wherein the step of amplifying is done with a fiber-amplifier and the step of compressing is done with an air-path between gratings compressor, and the initial wavelength-swept-with-time optical pulses is between about 10 picoseconds and about 3 nanoseconds and the compressed optical pulse has a sub-picosecond duration and an energy density on the surface is between about 2 and about 10 times an optical ablation threshold of the surface. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of removing material from a surface of a semiconductor wafer comprising the steps of:
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generating an initial wavelength-swept-with-time optical pulse in an optical pulse generator; amplifying the initial pulse; compressing the amplified pulse to a duration of less than about 10 picoseconds, to generate a compressed optical pulse; and applying the compressed optical pulse to the wafer surface, to remove material from the wafer surface; wherein pulse energy density and ablation rate are independently controlled. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method of removing material from a surface of a semiconductor wafer comprising the steps of:
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generating an initial wavelength-swept-with-time optical pulse in an optical pulse generator; amplifying the initial pulse; compressing the amplified pulse to a duration of less than about 10 picoseconds, to generate a compressed optical pulse; and applying the compressed optical pulse to the wafer surface, to remove material from the wafer surface; wherein a pulse energy density, a fiber amplifier operating temperature and an ablation rate are independently controlled.
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Specification