Apparatus and method for accurately tuning the speed of an integrated circuit

• US 7,116,142 B2
• Filed: 12/02/2004
• Issued: 10/03/2006
• Est. Priority Date: 12/02/2004
• Status: Active Grant

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Ferraiolo, Frank David, Fields, James Stephen Jr., James, Norman Karl, McCredie, Bradley David
• Primary Examiner(s): NGUYEN, LINH M
• Application Number:
  US11/002,548
• Publication Number:
  US 20060119397A1
• Time in Patent Office: 670 Days
• Field of Search: 327149-155, 327158-163, 331/17, 331/25, 331/DIG.2, 375/373, 375/375, 375/376
• US Class Current: 327/149
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937

Abstract

An apparatus and method for accurately tuning the speed of an integrated circuit, i.e. a computer chip, using a built-in sense circuit and controller are provided. The sense circuit is provided in association with a monitored path. The sense circuit includes a variable delay element coupled to a controller. A data signal from the monitored path is provided to the sense circuit which adds an amount of delay as determined by the controller to the data signal. The delayed data signal and the original data signal are compared to determine if their values match. If they match, then the amount of delay added by the variable delay element is increased. If they do not match, then a previous amount of delay, prior to the mismatch, is output as the slack of the monitored path. The slack may then be used to tune the speed of the integrated circuit.

Claims

1. A method for determining the slack in a monitored path on an integrated circuit, comprising:

capturing a data signal from the monitored path;

adding a first delay to the data signal from the monitored path to generate a delayed data signal;

comparing a first value of the data signal to a second value of the delayed data signal;

determining if the first value and the second value match; and

outputting a third value corresponding to a second delay of the delayed data signal, the third value being indicative of the slack in the monitored path for evaluating speed performance of the integrated circuit, if the first value and the second value do not match, wherein the third value is used to tune a speed of the integrated circuit.

2. The method of claim 1, wherein the third value corresponds to an amount of delay added to the data signal in a previous comparison of the first value to the second value just prior to the comparison resulting in the first value and second value not matching.

3. The method of claim 1, further comprising:

increasing an amount of the delay added to the data signal if the first value and the second value match; and

repeating the adding, comparing and determining steps using the increased amount of the delay.

4. The method of claim 1, wherein comparing a first value of the data signal to a second value of the delayed data signal includes providing the delayed data signal and the data signal to a comparator circuit element.

5. The method of claim 4, wherein the comparator circuit element is an exclusive OR gate.

6. The method of claim 3, wherein adding a first delay to the data signal from the monitored path to generate a delayed data signal includes inputting the data signal to a variable delay circuit element which outputs the delayed data signal to a capture latch, and wherein increasing an amount of the delay added to the data signal if the first value and the second value match includes sending a control signal to the variable delay circuit element to increase the amount of the delay added by the variable delay circuit element to the data signal.

7. The method of claim 1, wherein the method is performed in response to a functional clocking of the monitored path.

8. The method of claim 1, wherein the method is performed in response to an early clocking of the monitored path in which an early clock signal is earlier in time or phase than a functional clock signal.

9. The method of claim 1, wherein the method is performed on chip in the integrated circuit after assembly of the integrated circuit in a functioning system.

10. The method of claim 1, wherein the method is performed on chip in the integrated circuit prior to assembly of the integrated circuit in a functioning system.

11. An apparatus for determining the slack in a monitored path on an integrated circuit, comprising:

a monitored circuit path;

a variable delay circuit element coupled to the monitored circuit path;

a comparator circuit element coupled to the variable delay circuit element; and

a controller circuit element coupled to the variable delay circuit element, wherein the variable delay circuit element receives a data signal from the monitored path and adds a first delay to the data signal from the monitored path to generate a delayed data signal, wherein a first value of the data signal is compared, in the comparator circuit element, to a second value of the delayed data signal, and wherein the controller determines if the first value and the second value match and outputs a third value corresponding to a second delay of the delayed data signal, the third value being indicative of the slack in the monitored path for evaluating speed performance of the integrated circuit, if the first value and the second value do not match, wherein the third value is used to tune a speed of the integrated circuit.

12. The apparatus of claim 11, wherein the third value corresponds to an amount of delay added to the data signal in a previous comparison of the first value to the second value just prior to the comparison resulting in the first value and second value not matching.

13. The apparatus of claim 11, wherein the controller circuit element increases an amount of the delay added to the data signal if the first value and the second value match.

14. The apparatus of claim 11, wherein the apparatus is embedded in an integrated circuit for dynamically adjusting speed of a path in the integrated circuit based on the third value, wherein the third value is a sensed maximum speed of the integrated circuit based on conditions of the integrated circuit.

16. The apparatus of claim 11, wherein the apparatus operates in response to a functional clocking of the monitored path.

17. The apparatus of claim 11, wherein the apparatus operates in response to an early clocking of the monitored path in which an early clock signal is earlier in time or phase than a functional clock signal.

18. The apparatus of claim 11, wherein the apparatus is on chip in the integrated circuit, and wherein the apparatus operates after assembly of the integrated circuit in a functioning system.

19. The apparatus of claim 11, wherein the apparatus is on chip in the integrated circuit, and wherein the apparatus operates prior to assembly of the integrated circuit in a functioning system.

15. An apparatus for determining the slack in a monitored path on an integrated circuit, comprising:

a monitored circuit path;

a variable delay circuit element coupled to the monitored circuit path;

a first capture latch coupled to the monitored path that receives a data signal from the monitored path and outputs the data signal to a comparator circuit element;

a second capture latch coupled to the variable delay circuit element that receives a delayed data signal from the variable delay circuit element and outputs the delayed data signal to the comparator circuit element; and

a controller circuit element coupled to the variable delay circuit element, wherein the variable delay circuit element receives a data signal from the monitored path and adds a first delay to the data signal from the monitored path to generate the delayed data signal, wherein a first value of the data signal is compared, in the comparator circuit element, to a second value of the delayed data signal, and wherein the controller determines if the first value and the second value match and outputs a third value corresponding to a second delay of the delayed data signal, the third value being indicative of the slack in the monitored path, if the first value and the second value do not match.

20. An apparatus for determining the slack in a monitored path on an integrated circuit, comprising:

means for receiving a data signal from the monitored path;

means for adding a first delay to the data signal from the monitored path to generate a delayed data signal;

means for adding a first delay to the data signal from the monitored path to generate a delayed data signal;

means for comparing a first value of the data signal to a second value of the delayed data signal;

means for determining if the first value and the second value match; and

means for outputting a third value corresponding to a second delay of the delayed data signal, the third value being indicative of the slack in the monitored path for evaluating speed performance of the integrated circuit, if the first value and the second value do not match, wherein the third value is used to tune a speed of the integrated circuit.