Method of displaying dynamically scattering vector of X-ray diffraction

• US 7,120,227 B2
• Filed: 05/25/2004
• Issued: 10/10/2006
• Est. Priority Date: 05/29/2003
• Status: Expired due to Fees

• Current Assignee: Rigaku Corporation
• Original Assignee: Rigaku Corporation
• Inventors: Yamaguchi, Susumu, Ozawa, Tetsuya, Kakefuda, Kohji
• Primary Examiner(s): Bruce, David V.
• Assistant Examiner(s): SONG, HOON K
• Application Number:
  US10/854,562
• Publication Number:
  US 20050002488A1
• Time in Patent Office: 868 Days
• Field of Search: 378/87, 378/73, 378/70, 378/80
• US Class Current: 378/87
• CPC Class Codes: G01N 23/2055 Analysing diffraction patterns

Abstract

The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.

Claims

1. A method of dynamically displaying a scattering vector of X-ray diffraction comprising a step of:

displaying two-dimensionally or three-dimensionally a dynamic motion and tracks of a tip location of a scattering vector of X-ray diffraction under changing measuring conditions of X-ray diffraction on a display screen which represents a reciprocal space of a sample crystal.

2. A method according to claim 1, wherein said dynamic motion and tracks is displayed during X-ray diffraction measurement.

3. A method according to claim 1, wherein said displaying step includes:

acquiring a change of measuring conditions from a measuring-condition setting device; and

displaying said dynamic motion and tracks in accordance with said change of measuring conditions acquired.

4. A method according to claim 1, wherein said tracks is displayed along with information about an X-ray diffraction intensity.

5. A method according to claim 4, wherein said information is expressed in a color of said tracks.

6. A method according to claim 4, wherein said information is expressed in a width of said tracks.

7. A method according to claim 1, further comprising a step of superimposing locations of reciprocal lattice points on said tracks.