Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope

• US 7,123,408 B2
• Filed: 01/14/2005
• Issued: 10/17/2006
• Est. Priority Date: 06/17/2000
• Status: Expired due to Term

• Current Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Original Assignee: Leica Microsystems Gmbh (Danaher Corporation)
• Inventors: Storz, Rafael, Birk, Holger
• Primary Examiner(s): Robinson, Mark A.
• Application Number:
  US11/034,888
• Publication Number:
  US 20050122580A1
• Time in Patent Office: 641 Days
• Field of Search: 359/368, 359/385, 359/386, 359/388, 359/389, 372/92
• US Class Current: 359/385
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: G02B 21/002 Scanning microscopes scanning near field optical microscopes G01Q60/18
• CPC Class Codes: G02B 21/0024 Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 21/0064 multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling G02B21/0076 takes precedence
• CPC Class Codes: G02B 21/0076 arrangements using fluorescence or luminescence
• CPC Class Codes: G02B 21/008 Details of detection or image processing, including general computer control
• CPC Class Codes: G02B 21/06 Means for illuminating specimens
• CPC Class Codes: G02B 6/02366 Single ring of structures, e.g. "air clad"
• CPC Class Codes: G02B 6/02371 Cross section of longitudinal structures is non-circular
• CPC Class Codes: G02B 6/02376 Longitudinal variation along fibre axis direction, e.g. tapered holes
• CPC Class Codes: G02B 6/1225 comprising photonic band-gap structures or photonic lattices
• CPC Class Codes: G02B 6/2552 reshaping or reforming of light guides for coupling using thermal heating, e.g. tapering, forming of a lens on light guide ends
• CPC Class Codes: H01S 3/005 Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping shaping laser beam for working metal or other materials B23K26/06; optical elements, systems or apparatus in general G02B
• CPC Class Codes: H01S 3/1625 titanium
• CPC Class Codes: H01S 3/1636 Al2O3 (Sapphire)

Abstract

The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).

Claims

1. An illumination arrangement comprising:

a confocal scanning microscope;

a laser which has a light exit opening;

an optical component made of photonic band-gap material which is optically connected to the light exit opening; and

a detector;

wherein the confocal scanning microscope includes;

optics, wherein the optics include a beamsplitter positioned in a beam path of a beam of light emanating from the optical component that directs at least a portion of the light emanating from the optical component towards additional optical components adapted to direct the light from the beamsplitter to a specimen and to direct light from the specimen to the detector, and

wherein the optical component does not include a light-guiding fiber.

2. The illumination arrangement as defined in claim 1, wherein the laser is a pulsed laser.

3. The illumination arrangement of claim 1, further comprising an illumination pinhole interposed in a beam path between the optical component made of photonic band-gap material and the beamsplitter.

4. The illumination arrangement of claim 1, further comprising a pinhole interposed in a beam path between the beamsplitter and the detector, wherein the light from the specimen is directed through the pinhole before reaching the detector.

5. A method of viewing an object, comprising, in the following sequence:

generating a laser pulse;

directing the laser pulse though an optical component made of photonic band-gap material to obtain a spectrally broad-band illuminating light, wherein the optical component does not include a light-guiding fiber;

directing the spectrally broad-band illuminating light onto a beamsplitter;

directing the spectrally broad-band illuminating light onto a scanning mirror;

directing the spectrally broad-band illuminating light onto a specimen; and

directing light from the specimen to a detector.

6. The method of claim 5, further comprising imaging the spectrally broad-band illuminating light onto an illumination pinhole before the spectrally broad-band illuminating light reaches the beamsplitter.

7. The method of claim 5, further comprising executing the actions with a confocal scanning microscope.