Integrated gradiometer

• US 7,126,331 B2
• Filed: 07/29/2002
• Issued: 10/24/2006
• Est. Priority Date: 07/29/2002
• Status: Expired due to Fees

• Current Assignee: the united states of america as represented by the secretary of the navy
• Original Assignee: the united states of america as represented by the secretary of the navy
• Inventors: Miller, Michael, Johnson, Mark B.
• Primary Examiner(s): LEDYNH, BOT L
• Application Number:
  US10/206,456
• Publication Number:
  US 20040018644A1
• Time in Patent Office: 1,548 Days
• Field of Search: 324/244, 324/251, 324/252
• US Class Current: 324/251
• CPC Class Codes: G01R 33/022 Measuring gradient

Abstract

Magnetic field sensors, each generating an electrical output signal in proportion to the local magnetic field, are lithographically fabricated on a semiconductor substrate with a small spatial separation. The lateral dimension of the sensors and the separation length are the order of the minimum lithographic feature size. Comparing the electrical signals of the sensors results in a measurement of the local magnetic field gradient. Large field gradients, that vary on a small spatial scale, may be associated small magnetic structures such as microscopic magnetic particles. Detection of a field gradient can be used to infer the presence of a magnetic particle.

Claims

1. An integrated gradiometer for measuring a magnetic field gradient associated with a magnetic field, comprising:

a semiconducting substrate;

a first sensor, fabricated on the semiconducting substrate and responsive to the presence of the magnetic field, for producing a first electrical signal proportional to a first magnetic field strength of the magnetic field;

a second sensor, fabricated on the semiconducting substrate and responsive to the presence of the magnetic field, for producing a second electrical signal proportional to a second magnetic field strength of the magnetic field;

said first and second sensors being spaced apart at a distance effective for measuring a magnetic field gradient having a spatial scale of up to about 10 microns; and

a comparator, for receiving and comparing said first and second electrical signals, and for producing an output representing a magnitude of the magnetic field gradient applied across said sensors.

2. The gradiometer of claim 1, wherein said first and second sensors are spaced apart at a distance effective for measuring a magnetic field gradient having a spatial scale of up to about 1 micron.

3. The gradiometer of claim 1, wherein said first and second sensors each have a lateral dimension of up to about 1 micron.

4. The gradiometer of claim 1, wherein said first and second sensors are fabricated in a lateral geometry.

5. The gradiometer of claim 1, wherein said first and second sensors are fabricated in a vertical, stacked geometry.

6. The gradiometer of claim 1, wherein said first and second sensors are Hall effect devices.

7. The gradiometer of claim 1, wherein said first and second sensors are magnetoresistors.

8. The gradiometer of claim 1, wherein said first and second sensors are spin valves.

9. The gradiometer of claim 1, wherein said first and second sensors are magnetic tunnel junctions.

10. The gradiometer of claim 1, wherein said substrate is fixed to a scanning probe head and apparatus.

11. The device of claim 1, where the integrated gradiometer is fabricated near a surface that is proximal to a fluid flow channel.

12. An integrated gradiometer, comprising:

a first magnetic field sensor fabricated on a semiconducting substrate as a Hall plate using a first conducting layer, fabricated with lateral dimensions of up to about 10 microns, and capable of producing a first electrical signal in proportion to the local magnetic field at the position of said first sensor;

a second magnetic field sensor fabricated on the semiconducting substrate as a Hall plate using a second conducting layer, fabricated with lateral dimensions of up to about 10 microns, and capable of producing a second electrical signal in proportion to the local magnetic field at the position of said second sensor, and spatially separated from the first magnetic field sensor by a distance of up to about 10 microns; and

a comparator, for receiving and comparing said first and second electrical signals, and for producing an output representing a magnitude of a magnetic field gradient applied across said sensors.

13. The gradiometer of claim 12, wherein said first and second conducting layers are aligned in a vertical stack.

14. The gradiometer of claim 12, wherein said first and second conducting layers are fabricated on the same plane, aligned in lateral proximity.

15. An integrated gradiometer, comprising:

a first magnetic field sensor fabricated on a semiconducting substrate as a Hall plate using the bottom quantum well of a double quantum well heterostructure, fabricated with lateral dimensions of up to about 10 microns, and capable of producing a first electrical signal in proportion to the local magnetic field at the position of said first sensor;

a second magnetic field sensor fabricated on the semiconducting substrate as a Hall plate using the top quantum well of a double quantum well heterostructure, fabricated with lateral dimensions of up to about 10 microns, and capable of producing a second electrical signal in proportion to the local magnetic field at the position of said second sensor, and spatially separated from the first magnetic field sensor by a distance of up to about 10 microns; and

a comparator, for receiving and comparing said first and second electrical signals, and for producing an output representing a magnitude of a magnetic field gradient applied across said sensors.