Lithographic apparatus and device manufacturing method
First Claim
1. A lithography apparatus, comprising:
- a projection system configured to project a beam of radiation onto a substrate as an array of sub-beams of radiation;
an array of individually controllable elements configured to modulate said sub-beams of radiation; and
a data path including at least one data manipulation device arranged to at least partly convert data defining a requested pattern to a control signal suitable for controlling said array of individually controllable elements to form substantially said requested pattern on said substrate,wherein said at least one data manipulation device is arranged to carry out the conversion by applying a pseudo-inverted form of a point-spread function matrix to a column vector representing said requested pattern, said point-spread function matrix including information about the shape and relative position of the point-spread function of spots to be exposed on said substrate by one of said sub-beams of radiation at a given time.
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Accused Products
Abstract
A lithography apparatus including a projection system configured to project a beam of radiation onto a substrate as an array of sub-beams of radiation and an array of individually controllable elements configured to modulate the sub-beams of radiation. The apparatus also includes a data-path including at least one data manipulation device arranged to at least partly convert data defining a requested pattern to a control signal suitable for controlling the array of individually controllable elements to form substantially the requested pattern on the substrate. The data manipulation device is arranged to carry out the conversion by applying a pseudo-inverted form of a point-spread function matrix to a column vector representing the requested pattern. The point-spread function matrix includes information about the shape and relative position of the point-spread function of each spot to be exposed on the substrate by one of the sub-beams of radiation at a given time.
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Citations
10 Claims
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1. A lithography apparatus, comprising:
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a projection system configured to project a beam of radiation onto a substrate as an array of sub-beams of radiation; an array of individually controllable elements configured to modulate said sub-beams of radiation; and a data path including at least one data manipulation device arranged to at least partly convert data defining a requested pattern to a control signal suitable for controlling said array of individually controllable elements to form substantially said requested pattern on said substrate, wherein said at least one data manipulation device is arranged to carry out the conversion by applying a pseudo-inverted form of a point-spread function matrix to a column vector representing said requested pattern, said point-spread function matrix including information about the shape and relative position of the point-spread function of spots to be exposed on said substrate by one of said sub-beams of radiation at a given time. - View Dependent Claims (2, 3, 4, 5)
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6. A device manufacturing method, comprising:
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projecting a beam of radiation onto a substrate as an array of sub-beams of radiation; modulating the sub-beams of radiation with an array of individually controllable elements; and executing at a data manipulation device in a data path at least partial conversion of data defining a requested pattern to a control signal suitable for controlling the array of individually controllable elements to form substantially the requested pattern on the substrate, wherein the at least partial conversion of data is carried out by applying a pseudo-inverted form of a point-spread function matrix to a column vector representing the requested pattern, the point-spread function matrix including information about the shape and relative position of the point-spread function of spots to be exposed on the substrate by one of the sub-beams of radiation at a given time. - View Dependent Claims (7, 8, 9, 10)
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Specification