Method for entering circuit test mode

• US 7,127,630 B1
• Filed: 10/05/2001
• Issued: 10/24/2006
• Est. Priority Date: 10/26/2000
• Status: Expired due to Fees

• Current Assignee: Monterey Research, LLC (Vector Capital Corporation)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Snyder, Warren
• Primary Examiner(s): Barron, Jr., Gilberto
• Assistant Examiner(s): Perungavoor, Venkat
• Application Number:
  US09/972,133
• Time in Patent Office: 1,845 Days
• Field of Search: 365/201, 714/36, 714/724
• US Class Current: 713/502
• CPC Class Codes: G06F 11/2236 to test CPU or processors

Abstract

A method for entering test mode of an integrated circuit device is disclosed. In one embodiment of the present invention, after a lockout period, a test controller generates a signal indicating the integrated circuit is willing to enter the test mode. After the signal, the test controller monitors a test interface during a predetermined period of time for a digital password. Then, in response to a valid password being received within the predetermined period, the test controller enters the test mode. In another embodiment, in addition to the above steps, in response to the valid password being received, the test controller generates an acknowledge signal. In one embodiment, the predetermined period of time takes place during a holdoff period after the lockout period. In another embodiment, the test interface is serial.

Claims

1. A method for entering test mode of an integrated circuit under test, said method comprising:

generating a power-on reset release signal;

generating a synchronization pulse indicating said integrated circuit is willing to enter said test mode, said synchronization pulse output from said integrated circuit under test to an external controller coupled to said integrated circuit under test by a test interface;

after said synchronization pulse, monitoring a test interface for a digital password, wherein said generating a synchronization pulse and said monitoring a test interface occur within an interval of time that begins with said power-on reset release signal and has a predetermined length; and

entering said test mode in response to a valid password being received within said predetermined interval of time.

2. The method of claim 1, further comprising:

in response to said valid password being received, generating an acknowledge signal.

3. The method of claim 1 further comprising:

receiving commands via digital packets over said test interface.

4. The method of claim 1 further comprising:

a test controller coupled to a bus in said integrated circuit taking control of said bus in said test mode, wherein a microprocessor coupled to said bus becomes a slave.

5. The method of claim 1 wherein said generating a synchronization pulse and said monitoring a test interface occur during a holdoff period during which said integrated circuit is otherwise under reset.

6. The method of claim 1 wherein said password is received on one pin of said test interface while a clock signal is being received on another pin of said test interface.

7. The method of claim 1 wherein if said valid password is not detected during said predetermined interval of time said integrated circuit does not enter said test mode, wherein normal circuit operation is entered.

20. The method of claim 1 further comprising:

after entering said test mode, transferring instructions from said test interface into an instruction queue; and

causing a microprocessor to execute an instruction from said instruction queue, bypassing a memory containing instructions to be executed by said microprocessor when not in said test mode.

8. A method for entering test mode of an integrated circuit under test, said method comprising:

after a lockout period, generating a synchronization pulse indicating said integrated circuit under test is willing to enter said test mode, said synchronization pulse output from said integrated circuit under test to an external controller coupled to said integrated circuit under test by a test interface;

after said synchronization pulse, a test controller of said integrated circuit monitoring said test interface during a predetermined period of time for a digital password; and

said test controller entering said test mode in response to a valid password being received within said predetermined period of time.

9. The method of claim 8 further comprising:

upon voltage application to said integrated circuit, generating a lockout signal while voltage ramps up, said lockout signal defining said lockout period.

10. The method of claim 8, further comprising:

in response to said valid password being received, said test controller generating an acknowledge signal.

11. The method of claim 8 further comprising:

said test controller receiving commands via digital packets over said test interface, said test interface being a serial interface.

12. The method of claim 8 further comprising:

said test controller taking control of a bus in said integrated circuit in said test mode, wherein a microprocessor coupled to said bus becomes a slave.

13. The method of claim 8 wherein said digital password is received by said test controller via one pin of said test interface while a clock signal is being received by said test controller via another pin of said test interface and said test interface is serial.

14. The method of claim 8 wherein said digital password comprises a predetermined sequence of a plurality of bits.

21. The method of claim 8 further comprising:

after entering said test mode, transferring instructions from said external controller into a first memory comprising an instruction queue; and

causing a microprocessor to execute an instruction from said instruction queue, said microprocessor bypassing a second memory containing instructions to be executed by said microprocessor when not in said test mode.

15. A method for entering test mode of an integrated circuit device comprising:

upon voltage application to said integrated circuit, entering a lockout period while voltage ramps up;

generating a power-on reset release signal at the end of said lockout period;

during a first time interval that begins at the falling edge of said power-on reset release signal and has a first predetermined length, a test controller of said integrated circuit causing a synchronization pulse to be output over a serial test interface to an external controller coupled to said integrated circuit by said serial test interface, said pulse indicating said integrated circuit is willing to negotiate entry into said test mode;

during a second time interval that begins at the end of said first time interval and has a second predetermined length, said test controller monitoring said serial test interface for a digital password; and

in response to a valid password being received within said second time interval, said test controller entering said test mode.

16. The method of claim 15, further comprising:

in response to said valid password being received, said test controller generating an acknowledge signal.

17. The method of claim 15 further comprising:

said test controller receiving commands via digital packets over said test interface.

18. The method of claim 15 wherein said password is received by said test controller via one pin of said test interface while a clock signal is being received by said test controller via another pin of said test interface.

19. The method of claim 15 wherein said digital password comprises a plurality of bits.

22. The method of claim 15 further comprising:

after entering said test mode, said test controller transferring instructions received from said external controller over said serial test interface into a first memory comprising an instruction queue; and

said test controller controlling a multiplexer that selects an instruction from said first memory to cause a microprocessor to execute an instruction from said instruction queue, said multiplexer unselecting a second memory containing instructions to be executed by said microprocessor when not in said test mode.