X-tree test method and apparatus in a multiplexed digital system
First Claim
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1. An apparatus for testing a device under test, comprising:
- a plurality of contacts for electrical connection with a device under test;
a first driver for driving a first logic signal;
a second driver for driving a second logic signal, having a different value from the first logic signal;
circuitry for selectively connecting the first driver and the second driver with each of the plurality of contacts; and
a receiver, connected with the device under test, for measuring a response from the device under test to the first logic signal and the second logic signal applied, respectively, from the first driver and the second driver via the circuitry.
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Abstract
An X-Tree test apparatus for testing combinatorial logic circuits in a multiplexed digital system. The apparatus includes a plurality of contacts for electrical connection with pins on a device under test. A first driver drives a logic one signal, and a second driver drives a logic zero signal, both of which are used for testing the device. Multiplexing circuitry selectively connects the first driver and the second driver with each of the plurality of contacts and device pins. A receiver, connected with the device under test, measures a response from the logic circuit under test to the logic one and zero signals to determine if it functions as intended.
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Citations
12 Claims
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1. An apparatus for testing a device under test, comprising:
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a plurality of contacts for electrical connection with a device under test; a first driver for driving a first logic signal; a second driver for driving a second logic signal, having a different value from the first logic signal; circuitry for selectively connecting the first driver and the second driver with each of the plurality of contacts; and a receiver, connected with the device under test, for measuring a response from the device under test to the first logic signal and the second logic signal applied, respectively, from the first driver and the second driver via the circuitry. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for testing a device under test, comprising:
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providing a plurality of contacts for electrical connection with a device under test; driving a first logic signal to the device under test via the contacts; driving a second logic signal to the device under test via the contacts, the second logic signal having a different value from the first logic signal; selectively providing the first logic signal and the second logic signal to the device under test via the plurality of contacts; and measuring a response from the device under test to the first logic signal and the second logic signal. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification