Anodizing system with a coating thickness monitor and an anodized product

• US 7,128,985 B2
• Filed: 12/30/2003
• Issued: 10/31/2006
• Est. Priority Date: 12/21/2000
• Status: Expired due to Term

• Current Assignee: Sensory Analytics, LLC
• Original Assignee: Sensory Analytics, LLC
• Inventors: Price, Joseph K.
• Primary Examiner(s): TURNER, ARCHENE A
• Application Number:
  US10/748,704
• Publication Number:
  US 20040231993A1
• Time in Patent Office: 1,036 Days
• Field of Search: 428/701, 428/702
• US Class Current: 428/701
• CPC Class Codes: C25D 11/005 Apparatus specially adapted for electrolytic conversion coating apparatus in general for electrolytic coating C25D17/00
• CPC Class Codes: C25D 11/04 of aluminium or alloys based thereon
• CPC Class Codes: C25D 21/12 Process control or regulation controlling or regulating in general G05

Abstract

An anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The anodizing system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.

Claims

1. A substrate including an anodized coating, said coating having a thickness quality of about 1.3 times better than a coating thickness quality of an anodized substrate made without a coating thickness monitor communicating with a controller, said coating thickness monitor including:

a) at least one radiation source directed at at least a portion of the anodized substrate;

b) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; and

c) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate.

2. The substrate of claim 1 further including an additional coating on said anodized coating.

3. The substrate of claim 2 wherein the anodized coating is made with a coating thickness monitor in communication with a controller.

4. The substrate of claim 3, wherein the coating thickness monitor includes an additional radiation source.

5. The substrate of claim 1 wherein the anodized coating is made with a coating thickness monitor in communication with a controller.

6. The substrate of claim 5, wherein the coating thickness monitor includes an additional radiation source.

7. A substrate including an anodized coating, said coating having a thickness quality of at least about 1.3 times better and a thickness consistency of about 1.6 times better thereby having a thickness quality x consistency product at least about 2 times better than a coating thickness quality x consistency product of an anodized substrate made without a coating thickness monitor communicating with a controller, said coating thickness monitor including:

a) at least one radiation source directed at at least a portion of the anodized substrate;

b) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; and

c) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate.

8. The substrate of claim 7 wherein the anodized coating is made with a coating thickness monitor in communication with a controller.

9. The substrate of claim 8, wherein the coating thickness monitor includes an additional radiation source.

10. A substrate including an anodized coating and an additional coating on said anodized coating, said anodized coating having a thickness quality of at least about 1.3 times better and a thickness consistency of about 1.6 times better thereby having a thickness quality x consistency product at least about 2 times better than a coating thickness quality x consistency product of an anodized substrate made without a coating thickness monitor communicating with a controller, said coating thickness monitor including:

a) at least one radiation source directed at at least a portion of the anodized substrate;

b) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; and

c) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate.

11. The substrate of claim 10 wherein the anodized coating is made with a coating thickness monitor in communication with a controller.

12. The substrate of claim 11, wherein the coating thickness monitor includes an additional radiation source.