Method of manufacturing a spectral filter for green and shorter wavelengths

• US 7,135,120 B2
• Filed: 06/04/2003
• Issued: 11/14/2006
• Est. Priority Date: 06/04/2002
• Status: Expired due to Fees

• Current Assignee: Lake Shore Cryotronics, Inc.
• Original Assignee: Lake Shore Cryotronics, Inc.
• Inventors: Kochergin, Vladimir, Swinehart, Philip
• Primary Examiner(s): Ahmed, Shamim
• Application Number:
  US10/453,938
• Publication Number:
  US 20040045932A1
• Time in Patent Office: 1,259 Days
• Field of Search: 216/2, 216/24, 216/39, 216/56, 216/67, 216/79, 216/99, 205/656
• US Class Current: 216/24
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: G02B 5/201 in the form of arrays
• CPC Class Codes: G02B 5/204 in which spectral selection is performed by means of a conductive grid or array, e.g. frequency selective surfaces for use with wavelengths longer than the infrared light H01Q15/0006
• CPC Class Codes: G02B 5/207 comprising semiconducting materials
• CPC Class Codes: G02B 5/208 for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation
• CPC Class Codes: G02B 5/22 Absorbing filters G02B5/201 - G02B5/208 take precedence
• CPC Class Codes: G02B 6/1225 comprising photonic band-gap structures or photonic lattices
• CPC Class Codes: G03F 7/70575 Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
• CPC Class Codes: G03F 7/70941 Stray fields and charges, e.g. stray light, scattered light, flare, transmission loss
• CPC Class Codes: G03F 7/70958 Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties

Abstract

The UV, deep UV and/or far UV (ultraviolet) filter transmission spectrum of an MPSi spectral filter is optimized by introducing at least one layer of substantially transparent dielectric material on the pore walls. Such a layer will modify strongly the spectral dependences of the leaky waveguide loss coefficients through constructive and/or destructive interference of the leaky waveguide mode inside the layer. Increased blocking of unwanted wavelengths is obtained by applying a metal layer to one or both of the principal surfaces of the filter normal to the pore directions. The resulting filters are stable, do not degrade over time and exposure to UV irradiation, and offer superior transmittance for use as bandpass filters. Such filters are useful for a wide variety of applications including but not limited to spectroscopy and biomedical analysis systems.

Claims

1. A method of making a spectral filter comprising:

providing a substrate wafer of single-crystal semiconductor having a first surface and a second surface,

etching the substrate wafer to provide a structured macroporous layer having pores with controlled depths defined at least partially therethrough,

coating the pores wit at least one layer of a material substantially transparent within the pass-band of said spectral filter, said material having a thickness of at least 10 nm, and

removing at least one un-etched portion of the substrate wafer to thereby provide a spectral filter.

2. The method of claim 1 wherein said semiconductor substrate wafer comprises a silicon wafer.

3. The method of claim 2 wherein said etching comprises electrochemical etching and includes connecting the substrate as an electrode, contacting the first surface of the substrate with an electrolyte, setting a current density which will influence etching erosion, and continuing etching to form said pores extending to a desired depth substantially perpendicular to said first surface.

4. The method of claim 3, wherein said electrochemical etching occurs in a fluoride-containing, acidic electrolyte.

5. The method of claim 4, wherein said electrolyte contains hydrofluoric acid in a range of 1% to 50% by volume.

6. The method of claim 4, wherein said electrolyte additionally contains an oxidizing agent.

7. The method of claim 4, wherein said electrolyte additionally contains a hydrogen-contributing reducing agent.

8. The method of claim 7, wherein said hydrogen reducing agent is selected from the group of chemicals consisting of mono functional alkyl alcohols, tri functional alkyl alcohols, and tri functional alkyl alcohols.

9. The method of claim 4, wherein said electrolyte additionally contains a viscosity-increasing agent.

10. The method of claim 4, wherein said electrolyte additionally contains a conductivity-modifying agent.

11. The method of claim 4, wherein said electrolyte additionally contains a wetting agent.

12. The method of claim 3, wherein electrochemical etching parameters are selected from the group consisting of electrical current density, illumination intensity and/or applied voltage are set approximately constant during the electrochemical etching process.

13. The method of claim 3, wherein at least one electrochemical etching parameter selected from the group consisting of electrical current density, illumination intensity and/or applied voltage is changing in a predetermined fashion with time during the electrochemical etching process.

14. The method of claim 2, wherein said silicon wafer is a <

100>

-oriented wafer, and

wherein the electrolyte additionally contains at least one organic additive.

15. The method of claim 14, wherein the said at least one organic additive is selected from the group consisted of acetonitrile, dimethylformamide, dimethylsulfoxide, diethylenglycol, formamide, hexamethylphosphoric triamide, isopropanol, triethanolamine, 2-methoxyethyl ether, triethylphosphite, and triethyleneglycol dimethyl ether.

16. The method of claim 14 further including illuminating a second surface of the substrate wafer that lies opposite the first surface during electrochemical etching.

17. The method of claim 14, wherein electrical current density is set approximately constant during said electrochemical etching.

18. The method of claim 16, wherein at least one electrochemical etching parameter selected from the group consisting of electrical current density, illumination intensity and/or applied voltage is changing in a predetermined fashion with time during the electrochemical etching.

19. The method of claim 1 wherein said semiconductor substrate wafer is of material chosen from the full possible range of alloys and compounds of zinc, cadmium, mercury, silicon, germanium, tin, lead, aluminum, gallium, indium, bismuth, nitrogen, oxygen, phosphorus, arsenic, antimony, sulfur, selenium and tellurium, and

wherein said etching comprises electrochemical etching and includes connecting the substrate as an electrode, contacting the first surface of the substrate with an electrolyte, setting a current density which will influence etching erosion, and continuing etching to form said pores extending to a desired depth substantially perpendicular to said first surface.

20. The method of claim 3, wherein said electrochemical etching occurs in an acidic electrolyte.

41. The method of claim 1 further including using said spectral filter to spectrally filter light at green and shorter wavelengths.

21. A method of making a spectral filter, said method comprising:

providing a substrate wafer of single-crystal semiconductor having a first surface and a second surface,

etching the substrate wafer to provide a macroporous structured layer having pores with controlled depths defined at least partially therethrough,

removing at least one un-etched part of the substrate wafer, and

coating the pores with at least one layer of a material substantially transparent within the pass-band of said spectral filter material and having a thickness of at least 10 nm to thereby provide a spectral filter,

wherein said semiconductor substrate wafer is a silicon wafer, and

wherein said etching comprises electrochemical etching and includes connecting the substrate as an electrode, contacting the first surface of the substrate with an electrolyte, setting a current density which will influence etching erosion, and continuing etching to form said pores extending to a desired depth substantially perpendicular to said first surface.

22. The method of claim 21, wherein said electrochemical etching occurs in a fluoride-containing acidic electrolyte.

23. The method of claim 22, wherein said electrolyte contains hydrofluoric acid in a range of 1% to 50%.

24. The method of claim 22, wherein said electrolyte additionally contains an oxidizing agent.

25. The method of claim 24, wherein said electrolyte additionally contains a hydrogen-contributing reducing agent.

26. The method of claim 25, wherein said hydrogen-contributing reducing agent is selected from the group of chemicals consisting of mono functional alkyl alcohols, tri functional alkyl alcohols and tri functional alkyl alcohols.

27. The method of claim 22, wherein said electrolyte additionally contains at least one viscosity increasing agent.

28. The method of claim 22, wherein said electrolyte additionally contains at least one conductivity modifying agent.

29. The method of claim 22, wherein said electrolyte additionally contains at least one wetting agent.

33. The method of claim 21, wherein at least one electrochemical etching parameter selected from the group consisting of electrical current density, illumination intensity and/or applied voltage is varied in a predetermined fashion with lime during the electrochemical etching process.

30. A method of making a spectral filter, said method comprising:

providing a substrate wafer of single-crystal semiconductor having a first surface and a second surface,

etching the substrate wafer to provide a macroporous structured layer having pores with controlled depths defined at least partially therethrough,

removing at least one un-etched part of the substrate wafer, and

coating the pores with at least one layer of a material substantially transparent within the pass-band of said spectral filter material and having a thickness of at least 10 nm to thereby provide a spectral filter,

wherein said semiconductor substrate wafer is a silicon wafer, and

wherein said silicon wafer is of <

100>

-orientation, and

wherein said silicon wafer comprises an n-type doped wafer.

31. The method of claim 30 further including illuminating a second surface of the substrate wafer that lies opposite the first surface during electrochemical etching.

32. The method of claim 31, wherein electrochemical etching parameters are selected from the group consisting of electrical current density, illumination intensity, temperature and/or applied voltage are set approximately constant during the electrochemical etching process.

34. A method of making a spectral filter, said method comprising:

providing a substrate wafer of single-crystal semiconductor having a first surface and a second surface,

etching the substrate wafer to provide a macroporous structured layer having pores with controlled depths defined at least partially therethrough,

removing at least one un-etched part of the substrate wafer, and

coating the pores with at least one layer of a material substantially transparent within the pass-band of said spectral filter material and having a thickness of at least 10 nm to thereby provide a spectral filter,

wherein said semiconductor substrate wafer is a silicon wafer, and

wherein said silicon wafer is of <

100>

-orientation, and

wherein said silicon wafer is a p-type doped wafer, and

wherein the electrolyte additionally contains at least one organic additive.

35. The method of claim 34, wherein the said at least one organic additive is selected from the group consisted of acetonitrile, dimethylformamide, dimethylsulfoxide, diethylenglycol, formamide, hexamethylphosphoric triamide, isopropanol, triethanolamine, 2-methoxyethyl ether, triethylphosphite, triethyleneglycol dimethyl ether.

36. The method of claim 34 further including illuminating a second surface of the substrate wafer that lies opposite the first surface during electrochemical etching.

37. The method of claim 34, wherein electrical current density is set approximately constant during electrochemical etching process.

38. The method of claim 36, wherein at least one electrochemical etching parameter selected from the group consisting of electrical current density, illumination intensity and/or applied voltage is changing at a predetermined fashion during electrochemical etching process.

39. A method of making a spectral filter, said method comprising:

providing a substrate wafer of single-crystal semiconductor having a first surface and a second surface,

etching the substrate wafer to provide a macroporous structured layer having pores with controlled depths defined at least partially therethrough,

removing at least one un-etched part of the substrate wafer, and

coating the pores with at least one layer of a material substantially transparent within the pass-band of said spectral filter material and having a thickness of at least 10 nm to thereby provide a spectral filter,

wherein said semiconductor substrate wafer is of material chosen from the full possible range of alloys and compounds of zinc, cadmium, mercury, silicon, germanium, tin, lead, aluminum, gallium, indium, bismuth, nitrogen, oxygen, phosphorus, arsenic, antimony, sulfur, selenium and tellurium, and

wherein said etching is electrochemical etching and includes connecting the substrate as an electrode, contacting the first surface of the substrate with an electrolyte, setting a current density which will influence etching erosion, and continuing etching to form said pores extending to a desired depth substantially perpendicular to said first surface.

40. The method of claim 39, wherein said electrochemical etching occurs in an acidic electrolyte.