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Circuits for transistor testing

  • US 7,145,356 B2
  • Filed: 12/23/2004
  • Issued: 12/05/2006
  • Est. Priority Date: 12/24/2003
  • Status: Expired due to Fees
First Claim
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1. A circuit for testing a plurality of transistors including a first transistor and a second transistor, the circuit comprising:

  • a first resistor connected between a gate and a, drain of the first transistor, the first resistor dropping a first voltage applied to the gate of the first transistor to a second voltage applied to the drain of the first transistor,a second resistor connected between a gate and a drain oldie second transistor, the second resistor dropping a third voltage applied to the gate of the second transistor to a fourth voltage applied to the drain of the second transistor, anda third resistor connected between the gate of the first transistor and the gate of the second transistor, the first resistor dropping the first voltage to the third voltage.

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