Auto-deep scan for capacitive sensing

• US 7,148,703 B2
• Filed: 05/14/2004
• Issued: 12/12/2006
• Est. Priority Date: 05/14/2004
• Status: Active Grant

• Current Assignee: Zircon Corporation
• Original Assignee: Zircon Corporation
• Inventors: Miller, Lawrence F.
• Primary Examiner(s): Hirshfeld, Andrew H.
• Assistant Examiner(s): ZHU, JOHN X
• Application Number:
  US10/846,337
• Publication Number:
  US 20050253597A1
• Time in Patent Office: 942 Days
• Field of Search: 324/686, 324/662, 324/67, 324/663, 324/665
• US Class Current: 324/662
• CPC Class Codes: G01V 3/088 operating with electric fields G01V3/082 takes precedence

Abstract

A stud or joist sensor and associated sensing method using an amplitude and a ratio of capacitance measurements from a plurality of capacitive sensing elements. The sensor locates a feature of an object or discontinuity behind a surface or wall, such as an edge and/or a center of a stud behind the surface, a joist under a floorboard, a gap behind sheetrock, a metal conductor behind a surface or the like. The sensor may be moved over the surface, thereby detecting changes in capacitance. The change in capacitance is due to the effective dielectric constant caused by the passage over a hidden object such as a stud. When two capacitive sensing elements provide equivalent capacitance measures, the sensor is over a centerline of the stud. When a ratio of the capacitance measurements equals a transition ratio, the sensor is over an edge of the stud. When the sensor is over the stud and the capacitance measurements are low, the sensor is over a deep stud.

Claims

1. A sensor for finding a feature of a structure behind a surface comprising:

a first plate having a first capacitance and adapted for forming a first capacitor with the structure;

a second plate having a second capacitance and adapted for forming a second capacitor with the structure;

a first measurement circuit coupled to the first plate, the first measurement circuit measuring a first capacitance value of the first capacitor;

a second measurement circuit coupled to the second plate, the second measurement circuit measuring a second capacitance value of the second capacitor; and

a comparison circuit coupled to the first and second measurement circuits, the comparison circuit generating a ratio of the first and second capacitance values to determine a lateral location of the feature relative to the plates and comparing one of the first or second capacitance values to a first threshold to determine a depth of the feature relative to the surface, further comprising threshold circuitry coupled to first and second measurement circuits, the threshold circuitry determining whether the first and second capacitance values are above a second threshold to determine if the feature is deep.

2. The sensor of claim 1, wherein:

the first capacitance value represents a difference between the first capacitance and an initial capacitance of the first capacitor; and

the second capacitance value represents a difference between the second capacitance and an initial capacitance of the second capacitor.

3. The sensor of claim 1, further comprising a processing circuit coupled to the comparison circuit and coupled to receive the ratio value.

4. The sensor of claim 3, wherein the processing circuit determines whether the ratio is within a predetermined range.

5. The sensor of claim 4, further including an indicator coupled to the processing circuit, the indicator providing an indication that the sensor is over an edge of the structure when the ratio is within the predetermined range.

6. The sensor of claim 3, wherein the processing circuit determines whether the capacitance ratio is within a predetermined range of one.

7. The sensor of claim 6, further including an indicator coupled to the processing circuit, the indicator providing an indication that the sensor is over a centerline of a portion of the structure when the ratio is within the range of one.

8. The sensor of claim 5, further including a memory storing look-up table and coupled to the processing circuit, the look-up table having a transition ratio for the processing circuit, wherein the transition ratio is used to set the predetermined range.

9. The sensor of claim 3, further comprising:

a source of a reference voltage;

wherein the first measurement circuit includes a first index, the first index indicating a number of clock cycles needed to charge the first plate to the reference voltage level; and

wherein the second measurement circuit includes a second index, the second index indicating a number of clock cycles needed to charge the second plate to the reference voltage level.

10. The sensor of claim 9, wherein the first and second measurement circuits respectively include:

a current source coupled to a respective one of the first or second plates;

a discharge switch coupled to the respective one of the first or second plates;

a digital-to-analog converter (DAC) having an input terminal coupled to receive a data signal from the processing circuit and an output terminal; and

a comparator having a first input terminal coupled to the respective one of the first or second plates, a second input terminal coupled to the DAC, and an output terminal providing the output signal of the measurement circuit.

11. A sensor comprising:

a first plate and a second plate positioned in about the same plane and spaced apart, and adapted to be located adjacent a surface;

a measurement circuit coupled to the first and second plates thereby to measure a capacitance value of each of the plates;

a first comparison circuit coupled to receive the measured capacitance values and determine a ratio between a change in the measured capacitance values to determine a lateral location of a feature behind the surface relative to the plates; and

a second comparison circuit coupled to receive one of the measured capacitance values and a threshold and to provide a comparison therebetween to determine a depth of the feature relative to the surface,

further comprising an indicator coupled to the second comparison circuit thereby to provide an indication of the depth of the feature behind the surface.

12. The sensor of claim 11, further comprising an indicator coupled to the first comparison circuit thereby to provide an indication of the ratio of the capacitances.

13. The sensor of claim 12, wherein the indication is that the ratio is approximately equal to a predetermined ratio, thereby locating an edge of an object behind the surface.

14. The sensor of claim 12, wherein the indication is that the ratio is approximately equal to one, thereby locating a centerline of an object behind the surface.