Probe for use in determining an attribute of a coating on a substrate

• US 7,148,712 B1
• Filed: 06/24/2005
• Issued: 12/12/2006
• Est. Priority Date: 06/24/2005
• Status: Expired due to Fees

• Current Assignee: Oxford Instruments Measurement Systems LLC (Oxford Instruments PLC)
• Original Assignee: Oxford Instruments Measurement Systems LLC (Oxford Instruments PLC)
• Inventors: Prey, John E. Jr., Tom, Joseph
• Primary Examiner(s): Hollington, Jermele
• Assistant Examiner(s): Vazquez, Arleen M.
• Application Number:
  US11/166,560
• Publication Number:
  US 20060290362A1
• Time in Patent Office: 536 Days
• Field of Search: 324/754, 324/770, 324/72.5, 324/133
• US Class Current: 324/754.07
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

A probe provides electrical communication between a coating and a processing system. One optional feature includes an outwardly projecting, electrically conductive engaging member that is held in a captivation structure releasably retained in a housing and engages a contact that is inside the probe and connected with the processing system. Another optional feature of the probe provides the electrically conductive engaging member in the form of a pin or pins captivated in a light-transmissive structure adjacent a light-emitting source. Another optional feature of the probe includes a restraining structure that defines a frustoconical seat for engaging a conical distal end of an electrically conductive pin that is adapted to contact the coating.

Claims

1. A probe for providing electrical communication between a coating on a substrate and a processing system that determines an attribute of the coating, such as the thickness of the coating, by detection of phenomena resulting from the application of electrical energy to the probe in contact with the coating, said probe comprising:

a housing;

at least one contact mounted within said housing;

an electrical circuit adapted to provide electrical communication between said contact and said processing system; and

at least one electrically conductive engaging member that (1) has a distal end projecting outwardly for engaging said coating, (2) has a proximal portion in said housing for engaging said at least one contact and for accommodating disengagement from said at least one contact, and (3) is captivated partially in an electrically insulating captivation structure which can be removed from said housing together with said at least one electrically conductive engaging member.

2. The probe in accordance with claim 1 in which

said electrically conductive engaging member is a pin defining said distal end projecting outwardly for engaging said coating and defining said proximal portion for engaging said contact;

said captivation structure is molded from a non-conductive material having a passage in which a portion of said pin is captivated to hold said pin in a fixed orientation; and

said pin and said captivation structure together define an integral unit in the form of a tip that has

(1) an inner portion that is releasably received in said housing, and

(2) an extending portion that

(a) projects from said housing, and

(b) can be manually grasped by a user for pulling

said tip out of said housing without using a tool.

3. The probe in accordance with claim 2 in which

said pin includes a plunger defining said distal end;

said pin proximal portion includes a barrel that (1) is fixed in said captivation structure with a portion of said barrel exposed for engaging said contact, and (2) receives at least a portion of said plunger in a telescoping relationship to accommodate reciprocation of said plunger in said barrel; and

said pin includes a spring disposed in said barrel for biasing said plunger outwardly.

4. The probe in accordance with claim 3 in which said tip extending portion includes a peripheral platform that (1) is unitary with said captivation structure, (2) projects from said housing, and (3) extends laterally around at least a portion of the length of said plunger of said pin to provide support for said probe when said plunger is engaged with said coating and is forced against said spring further into said barrel of said pin.

5. The probe in accordance with claim 4 in which said peripheral platform defines an open viewing aperture to accommodate visual inspection of said plunger on said coating when said probe is supported by said peripheral platform over said coating.

6. The probe in accordance with claim 1 in which

said housing is a hand-holdable, tubular structure defining a receiving cavity with an access opening;

said contact includes an arm that is elastically deflectable in response to a force exerted on said arm by said proximal portion of said electrically conductive engaging member; and

a tip is releasably received in said receiving cavity of said housing and accessible at said receiving cavity access opening, said tip including said captivation structure containing said electrically conductive engaging member in the form of a pin captivated in a fixed orientation wherein said pin defines (1) said engaging member distal end projecting outwardly for engaging said coating, and (2) said engaging member proximal portion in said receiving cavity of said housing for engaging said contact.

7. The probe in accordance with claim 6 in which

said tubular structure has a peripheral wall that defines a slot having an enlarged recess and a reduced width opening to said recess;

and

said tip captivation structure includes a tab having an enlarged head and a reduced width neck whereby said tab head can be forced into said enlarged recess of said slot so that said tab neck is received in said reduced width opening of said slot to create a releasable snap-fit engagement.

8. The probe in accordance with claim 1 in which said electrical circuit includes at least one conductive wire that extends from said contact within said housing and that is adapted to be connected with said processing system.

9. The probe in accordance with claim 1 in which

said housing has a receiving cavity with an access opening;

said housing defines a pair of spread-apart channels adjacent said receiving cavity of said housing;

a printed circuit board is mounted in said spaced-apart channels in said receiving cavity of said housing;

said contact is mounted on said printed circuit board;

said contact includes an elastically deflectable arm projecting from said printed circuit board;

said electrically conductive engaging member is a pin that defines said distal end projecting outwardly for engaging said coating and that defines said proximal portion for engaging said contact;

said captivation structure captivates said pin in a fixed orientation; and

said pin and said captivation structure together define an integral unit in the form of a tip that has

(1) an inner portion that is releasably received in said receiving cavity of said housing, and

(2) an extending portion that

(a) projects from said housing, and

(b) can be manually grasped by a user for pulling said tip out of said housing without using a tool.

10. A probe for providing electrical communication between a coating on a substrate and a processing system that determines an attribute of the coating, such as the thickness of the coating, by detection of phenomena resulting from the application of electrical energy to the probe in contact with the coating, said probe comprising:

a housing having a receiving cavity with an access opening;

a plurality of contacts that are mounted within said receiving cavity of said housing;

an electrical circuit adapted to provide electrical communication between said contacts and said processing system; and

a tip releasably received in said receiving cavity of said housing and accessible at said access opening of said receiving cavity, said tip including a captivation structure containing a plurality of pins captivated in a spaced-apart array wherein each said pin has (1) a distal end projecting outwardly for engaging said coating, and (2) a proximal portion in said receiving cavity of said housing for engaging one of said contacts whereby said tip can be selectively either releasably retained within said housing or manually removed therefrom.

11. The probe in accordance with claim 10 in which

said captivation structure is molded from a non-conductive material having a passage in which a portion of each said pin is captivated to hold each said pin in a fixed orientation;

and

said tip has

(1) an inner portion that is releasably received in said housing, and

(2) an extending portion that

(a) projects from said housing, and

(b) can be manually grasped by a user for pulling said tip out of said housing without using a tool.

12. The probe in accordance with claim 11 in which

each said pin includes a plunger defining said distal end;

each said pin proximal portion includes a barrel that (1) is fixed in said captivation structure with a portion of said barrel exposed for engaging one of said contacts, and (2) receives at least a portion of said plunger in a telescoping relationship to accommodate reciprocation of said plunger in said barrel; and

said pin includes a spring disposed in said barrel for biasing said plunger outwardly.

13. The probe in accordance with claim 12 in which said tip extending portion includes a peripheral platform that (1) is unitary with said captivation structure, (2) projects from said housing, and (3) extends laterally around at least a portion of the length of said plunger of each said pin to provide support for said probe when said plunger is engaged with said coating and is forced against said spring further into said barrel of said pin.

14. The probe in accordance with claim 13 in which said peripheral platform defines an open viewing aperture to accommodate visual inspection of said plunger on said coating when said probe is supported by said peripheral platform over said coating.

15. The probe in accordance with claim 10 in which

said housing is a hand-holdable, tubular structure defining a receiving cavity with an access opening;

and

each said contact includes an arm that is elastically deflectable in response to a force exerted on said arm by said proximal portion of one of said pins.

16. The probe in accordance with claim 10 in which

said housing has a peripheral wall that defines a slot having an enlarged recess and a reduced width opening to said recess;

and

said tip captivation structure includes a tab having an enlarged head and a reduced width neck whereby said tab head can be forced into said enlarged recess of said slot so that said tab neck is received in said reduced width opening of said slot to create a releasable snap-fit engagement.

17. The probe in accordance with claim 10 in which said electrical circuit includes at least one conductive wire that extends from one of said contacts within said housing and that is adapted to be connected with said processing system.

18. The probe in accordance with claim 10 in which

said housing defines a pair of spread-apart channels adjacent said receiving cavity of said housing;

a printed circuit board is mounted in said spaced-apart channels in said receiving cavity of said housing;

each said contact is mounted on said printed circuit board; and

each said contact includes an elastically deflectable arm projecting from said printed circuit board for engaging said proximal portion of one of said pins.

19. A probe for providing electrical communication between a coating on a substrate and a processing system that determines an attribute of the coating, such as the thickness of the coating, by detection of phenomena resulting from the application of electrical energy to the probe in contact with the coating, said probe comprising:

a housing having a receiving cavity with an access opening;

at least four contacts that are mounted in a spaced-apart parallel planar array within said receiving cavity of said housing;

an electrical circuit adapted to provide electrical communication between said contacts and said processing system; and

a tip received in said receiving cavity of said housing and accessible at said access opening of said receiving cavity, said tip including a captivation structure containing four pins captivated in a spaced-apart, parallel, planar array wherein each said pin has (1) a distal end, and (2) a proximal portion, and wherein said housing and said tip together provide a snap-fit engagement structure for releasably holding at least a portion of said tip within said housing to orient said distal end of each said pin projecting outwardly for engaging said coating and to orient said proximal portion of each said pin in said receiving cavity of said housing for engaging one of said contacts whereby said snap-fit engagement structure between said housing and said tip can be released to permit manual removal of said tip from said housing.

20. The probe in accordance with claim 19 in which

said captivation structure molded from a thermoplastic material having a passage in which a portion of each said pin is captivated to hold each said pin in a fixed orientation;

and

said tip has

(1) a proximal portion that is releasably received in said housing, and

(2) an extending portion that

(a) projects from said housing, and

(b) can be manually grasped by a user for pulling said tip out of said housing without using a tool.

21. The probe in accordance with claim 20 in which

each said pin includes a plunger defining said distal end;

each said pin proximal portion includes a barrel that (1) is fixed in said captivation structure with a portion of said barrel exposed for engaging one of said contacts, and (2) receives at least a portion of said plunger in a telescoping relationship to accommodate reciprocation of said plunger in said barrel; and

each said pin includes a spring disposed in said barrel for biasing said plunger outwardly.

22. The probe in accordance with claim 21 in which said tip extending portion includes a peripheral platform that (1) is unitary with said captivation structure, (2) projects from said housing, and (3) extends laterally around at least a portion of the length of said plunger of each said pin to provide support for said probe when said plunger is engaged with said coating and is forced against said spring further into said barrel of said pin.

23. The probe in accordance with claim 22 in which said peripheral platform defines an open viewing aperture to accommodate visual inspection of said plunger on said coating when said probe is supported by said peripheral platform over said coating.

24. The probe in accordance with claim 19 in which

said housing is a hand-holdable, tubular structure defining a receiving cavity with an access opening;

and

each said contact includes an arm that is elastically deflectable in response to a force exerted on said arm by said proximal portion of one of said pins.

25. The probe in accordance with claim 19 in which

said housing has a peripheral wall that defines a slot having an enlarged recess and a reduced width opening to said recess;

and

said tip captivation structure includes a tab having an enlarged head and a reduced width neck whereby said tab head can be forced into said enlarged recess of said slot so that said tab neck is received in said reduced width opening of said slot to create a releasable snap-fit engagement, and define said snap-fit engagement structure.

26. The probe in accordance with claim 19 in which said electrical circuit includes at least one conductive wire that extends from one of said contacts within said housing and that is adapted to be connected with said processing system.

27. The probe in accordance with claim 19 in which

said housing defines a pair of spread-apart channels adjacent said receiving cavity of said housing;

a printed circuit board is mounted in said spaced-apart channels in said receiving cavity of said housing;

each said contact is mounted on said printed circuit board; and

each said contact includes an elastically deflectable arm projecting from said printed circuit board for engaging said proximal portion of one of said pins.

28. A probe for providing electrical communication between a coating on a substrate and a processing system that determines an attribute of the coating, such as the thickness of the coating, by detection of phenomena resulting from the application of electrical energy to the probe in contact with the coating, said probe comprising:

a housing having a receiving cavity with an access opening;

a light transmissive captivation structure that is mounted in said receiving cavity of said housing for communication through said receiving cavity access opening with the exterior of said probe;

at least one electrically conductive pin that (1) has a portion captivated in a fixed orientation within said light transmissive captivation structure, (2) has a distal end projecting outwardly of said light transmissive captivation structure for engaging said coating, and (3) is connected with an electrical circuit adapted to provide electrical communication with said processing system; and

a light emitting source in said housing for emitting light through said light transmissive captivation structure along said pin to illuminate said pin distal end.

29. The probe in accordance with claim 28 in which

said light transmissive captivation structure is molded from a thermoplastic material having a passage in which a portion of said pin is captivated to hold said pin in said fixed orientation;

said housing is a generally tubular, opaque structure;

at least one contact is mounted in said tubular, opaque structure, and said at least one contact is connected with said electrical circuit adapted to provide electrical communication with said processing system; and

said pin and said light transmissive captivation structure together define an integral unit in the form of a tip that has (1) an inner portion that is received in said housing so as to effect engagement between said pin and said contact, and (2) an extending portion that projects from said housing at said receiving cavity access opening.

30. The probe in accordance with claim 29 in which

said pin includes a plunger defining said distal end;

said pin includes a barrel that (1) is fixed in said light transmissive captivation structure with a portion of said barrel exposed within said receiving cavity for engaging said contact, and (2) receives at least a portion of said plunger in a telescoping relationship to accommodate reciprocation of said plunger in said barrel; and

said pin includes a spring disposed in said barrel for biasing said plunger outwardly.

31. The probe in accordance with claim 30 in which said tip extending portion includes a peripheral platform that (1) is unitary with said light transmissive captivation structure, (2) projects from said housing, and (3) extends laterally around at least a portion of the length of said plunger of said pin to provide support for said probe when said plunger is engaged with said coating and is forced against said spring further into said barrel of said pin.

32. The probe in accordance with claim 31 in which said peripheral platform defines an open viewing aperture to accommodate visual inspection of said plunger on said coating when said probe is supported by said peripheral platform over said coating.

33. The probe in accordance with claim 28 in which

said light transmissive captivation structure has (1) an extending portion projecting from said housing, and (2) an inner end terminating in said receiving cavity of said housing;

a printed circuit board is mounted in said housing adjacent said inner end of said light transmissive captivation structure; and

said light emitting source is a light emitting diode mounted on said printed circuit board to project over said inner end of said light transmissive captivation structure for emitting light into said inner end of said light transmissive captivation structure.

34. The probe in accordance with claim 28 in which said light transmissive captivation structure is a substantially transparent polycarbonate material which functions as a light pipe for accommodating passage of light from said light emitting source toward said pin distal end.

35. The probe in accordance with claim 28 in which said light transmissive captivation structure is a substantially transparent polycarbonate material which functions as a light pipe for accommodating passage of light from said light emitting source toward said pin distal end.

36. In a probe for providing electrical communication between a coating on a substrate and a processing system wherein

said processing system determines an attribute of the coating, such as the thickness of the coating, by detection of phenomena resulting from the application of electrical energy to a pin in contact with the coating, and

said pin includes (1) a plunger having a shank with a conical distal end that is symmetric about a longitudinal axis and that is adapted to engage said coating, (2) a proximal portion that includes a barrel that receives at least a portion of said plunger in a telescoping relationship to accommodate reciprocation of said plunger in said barrel, and (3) a spring in said barrel for biasing said plunger outwardly;

the improvement comprising;

a captivation structure for holding said pin in a fixed orientation in said probe, said captivation structure including

(a) a barrel restraining structure for restraining said barrel of said pin against axial and lateral movement; and

(b) a plunger restraining structure that (1) defines a frustoconical seat about an axis that is coincident with said longitudinal axis, and (2) engages said pin plunger shank conical distal end as said plunger is biased outwardly by said spring.

37. The improvement in accordance with claim 36 in which said frustoconical seat has a conic angle substantially equal to the conic angle of said pin plunger shank conical distal end.

38. The improvement in accordance with claim 36 in which

said pin plunger shank includes a cylindrical portion between said distal end and said barrel;

and

said captivation structure includes a cylindrical bore around said pin plunger shank cylindrical portion, said bore accommodating reciprocation of said pin plunger but limiting lateral displacement of said pin plunger shank cylindrical portion when said frustoconical seat moves away from said pin plunger shank conical distal end.