Method and apparatus for scanning a key or button matrix

• US 7,158,056 B2
• Filed: 07/08/2004
• Issued: 01/02/2007
• Est. Priority Date: 07/08/2004
• Status: Active Grant

• Current Assignee: Monterey Research, LLC (Vector Capital Corporation)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Wright, David G., Asbury, Ray
• Primary Examiner(s): WONG, ALBERT KANG
• Application Number:
  US10/888,666
• Publication Number:
  US 20060007023A1
• Time in Patent Office: 908 Days
• Field of Search: 341/20, 341/26, 345/168, 340/14.1
• US Class Current: 341/26
• CPC Class Codes: H03M 11/20 Dynamic coding, i.e. by key scanning H03M11/26 takes precedence

Abstract

An improved key matrix scanning technique conducts a first pre-scan on a first array of connections in a key matrix to identify any activated keys or buttons associated with the first array. A second sub-scan is conducted on a second array of connections in the key matrix but only for the connections in the first array that are detected as having activated keys.

Claims

1. A method of scanning a connection matrix, comprising:

conducting a first pre-scan of either the rows or columns connections of the connection-matrix to identify rows or columns with activated keys or buttons; and

conducting a second sub-scan of the connection-matrix to identify a particular connection in the rows or columns with activated keys or buttons wherein only the rows or columns identified as having activated keys or buttons in the pre-scan are scanned.

2. The method according to claim 1 wherein the first pre-scan scans the column connections and the second sub-scan scans only the row connections with activated keys or buttons identified from the pre-scan.

3. The method according to claim 2 including:

driving a first pre-scan signal on the row connections;

monitoring the column connections for the pre-scan signal; and

identifying any column connections deleted with the pre-scan signal as having activated keys or buttons.

4. The method according to claim 3 including:

driving a second sub-scan signal only on the column connections identified with activated keys or buttons;

monitoring all the row connections for the sub-scan signal;

identifying the row connections with by detecting the sub-scan signal; and

identifying the keys or buttons depressed by associating the detected sub-scan signal with a key or button in the matrix.

5. The method according to claim 1 including:

connecting each of the column connections to a known impedance state;

applying a first known voltage to each of the row connections;

sensing the voltage on the column connections that does not have a voltage applied;

generating a list of column connections that have the first known voltage;

connecting each of the row connections to the known impedance state;

applying the first known voltage only on the column connections identified in the list;

sensing the voltage on each of the row connections to identify the activated key.

6. The method according to claim 5 including:

applying the first known impedance state through a pull-up resistance; and

applying the first known voltage having an different logic value than the first known impedance state.

7. The method according to claim 1 including:

placing a microcontroller or logic in a low power sleep mode;

periodically walking up the microcontroller or logic for a time to conduct the pre-scan and the sub-scan;

identifying the pressed keys or buttons according to the pre-scan and the sub-scan; and

placing the microcontroller or logic back into to the sleep mode until a next periodic pre-scan and sub-scan.

8. The method according to claim 1 including conducting pre-scan and sub-scan in a wireless keyboard and wirelessly transmitting any identified pressed keys or buttons to a host processing device.

9. The method according to claim 1 including:

configuring the row connections as outputs and the column connections as inputs during the pre-scan; and

configuring the column connections as outputs and the row connections as inputs during the sub-scan.

10. A circuit for monitoring a connection-matrix, comprising:

processing circuitry configured to conduct a first scan of the rows of the connection-matrix to identify activated connections in particular columns and then conduct a second scan of only the columns identified in the first scan as having activated connections to identify particular activated connections in the connection-matrix.

11. The circuit according to claim 10 including logic circuitry that during the first scan puts the columns in a first high impedance logic state and applies a second logic state to the rows.

12. The circuit according to claim 11 wherein the logic circuitry during the second scan puts the rows in the high impedance logic state and applies the second logic state only to the columns identified in the first scan as having activated connections.

13. The circuit according to claim 10 wherein the logic circuitry comprises pull-up or pull-down resistance.

14. The circuit according to claim 10 wherein the processing circuitry includes bi-directional connections coupled to the rows and columns of the matrix, the bidirectional connections operating as inputs to the rows and outputs to the columns during the first scan and the bi directional connections operating as outputs to the rows and inputs to the columns during the second scan.

15. The circuit according to claim 10 wherein the circuitry is contained in a wireless keyboard and includes a wireless keyboard transmitter for sending key or button information to a computer associated with the keyboard.

16. The circuit according to claim 10 wherein the processor repeatedly goes into a sleep mode for a period of time and then periodically and repeatedly wakes-up to conduct the first and second scans.

17. A system for detecting the actuation of keys or buttons comprising:

a matrix including connections corresponding to the rows of keys or buttons and a of connections corresponding to the columns of keys or buttons; and

processing circuitry configured to conduct a first scan of either the rows or columns of the connection-matrix to identify activated connections in particular columns or rows and then conduct a second scan of only the rows or columns identified in the first scan as having activated connections to identify particular activated keys or buttons in the connection-matrix.

18. The system according to claim 17 including a bi-directional interface that uses the row connections as inputs and the column connections as au-outputs for the first scan and uses the column connections as inputs and the row connections as outputs for the second scan.

19. The system according to claim 18 including logic circuitry that sets the row connections to a first known logic state and then drives the column connections to a second logic state during the first scan, the logic circuitry setting the column connections to the first known logic state during the second scan and then applying the second logic state only to the row connections detected as having the second logic state during the first scan.