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Methods and apparatus for thermal management of an integrated circuit die

  • US 7,158,911 B2
  • Filed: 04/09/2004
  • Issued: 01/02/2007
  • Est. Priority Date: 03/30/1999
  • Status: Expired due to Term
First Claim
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1. A thermal management system for an integrated circuit die comprising:

  • a temperature sensor formed directly on the die, the temperature sensor including a reference voltage source providing a reference voltage, a second voltage source providing a second voltage proportional to a temperature of the die, and a comparator coupled with each of the reference voltage and second voltage sources, the comparator to provide a signal to an output of the temperature sensor indicative of the die temperature;

    a power modulation element formed directly on the die, the power modulation element to reduce power consumption of the die in response to the output of the temperature sensor;

    a control element formed directly on the die, the control element including at least one register to provide an enable/disable bit for the thermal management system; and

    a visibility element formed directly on the die, the visibility element to indicate a status of the output of the temperature sensor.

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