Semiconductor integrated circuit with security function
First Claim
Patent Images
1. A semiconductor integrated circuit, comprising:
- a plurality of detectors, wherein each detector detects a corresponding operating condition of the integrated circuit and generates a detection signal that indicates an abnormal condition;
a reset signal generator for generating a reset signal;
a nonvolatile memory;
a plurality of latch circuits for respectively latching the detection signals from the plurality of detectors, output signals from said plurality of latch circuits being fed to the nonvolatile memory;
a logic circuit connected to said output signals from said plurality of latch circuits and producing a program signal upon a latch output signal indicating an abnormal condition, said program signal fed to said nonvolatile memory to cause said latch circuit outputs to be stored therein and said program signal being fed to said reset signal generator for generating a reset signal in response thereto; and
a central processor unit (CPU) which is restarted in response to the reset signal after the detection signals have been stored in the nonvolatile memory in response to the program signal from the logic circuit, wherein upon restarting the CPU, a read signal is generated by the CPU to automatically read out stored detection signals from the nonvolatile memory to be referred to by a user to indicate there was an abnormal condition detected.
2 Assignments
0 Petitions
Accused Products
Abstract
An IC (integrated circuit) card (or smart card) comprising a plurality of detectors for detecting abnormal operating conditions of the IC card. If an abnormal condition is detected by one of the detectors, the detector will generate a detection signal, which is then stored in a nonvolatile memory. A reset signal is then generated in response to the detection signal to reset a central processor unit. The central processor unit informs a user of a reset status and a cause thereof.
-
Citations
16 Claims
-
1. A semiconductor integrated circuit, comprising:
-
a plurality of detectors, wherein each detector detects a corresponding operating condition of the integrated circuit and generates a detection signal that indicates an abnormal condition; a reset signal generator for generating a reset signal; a nonvolatile memory; a plurality of latch circuits for respectively latching the detection signals from the plurality of detectors, output signals from said plurality of latch circuits being fed to the nonvolatile memory; a logic circuit connected to said output signals from said plurality of latch circuits and producing a program signal upon a latch output signal indicating an abnormal condition, said program signal fed to said nonvolatile memory to cause said latch circuit outputs to be stored therein and said program signal being fed to said reset signal generator for generating a reset signal in response thereto; and a central processor unit (CPU) which is restarted in response to the reset signal after the detection signals have been stored in the nonvolatile memory in response to the program signal from the logic circuit, wherein upon restarting the CPU, a read signal is generated by the CPU to automatically read out stored detection signals from the nonvolatile memory to be referred to by a user to indicate there was an abnormal condition detected. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
-
8. An IC (integrated circuit) card, comprising:
-
an embedded CPU (central processing unit); a plurality of detectors, wherein each detector detects a corresponding operating condition of the IC card and generates a detection signal that indicates an abnormal condition; a reset signal generator for generating a reset signal; a nonvolatile memory; a plurality of latch circuits for respectively latching the detection signals from the plurality of detectors, output signals from said plurality of latches being fed to the nonvolatile memory; and a logic circuit connected to said output signals from said plurality of latch circuits and producing a program signal upon a latch output signal indicating an abnormal condition, said program signal fed to said nonvolatile memory to cause said latch circuit outputs to be stored therein and said program signal being fed to said reset signal generator for generating a reset signal in response thereto, wherein the embedded CPU is restarted in response to the reset signal after the detection signals have been stored in the nonvolatile memory in response to the program signal from the logic circuit, and wherein upon resetting of the CPU, a read signal is generated by the CPU to automatically read out a stored detection signal from the nonvolatile memory to be referred to by a user to indicate there was an abnormal condition detected. - View Dependent Claims (9, 10, 11, 12, 13)
-
-
14. A method for monitoring operation of an integrated circuit, comprising the steps of:
-
detecting a plurality of operating conditions of an integrated circuit; generating a detection signal if an abnormal operating condition is detected; storing the detection signal in nonvolatile memory; generating a reset signal; latching the detection signals from the step of generating feeding latched output signals to said nonvolatile memory; producing a program signal upon a latched output signal indicating an abnormal condition, feeding said program signal to said nonvolatile memory to cause said latched outputs to be stored therein and said program signal being used to start said step of generating a reset signal; resetting a CPU (central processing unit) in response to the reset signal after the detection signal has been stored in the nonvolatile memory; and
automatically reading out the stored detection signal from the nonvolatile memory after resetting the CPU in response to a read signal generated by the CPU upon resetting of the CPU. - View Dependent Claims (15, 16)
-
Specification