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Probe for testing a device under test

  • US 7,161,363 B2
  • Filed: 05/18/2004
  • Issued: 01/09/2007
  • Est. Priority Date: 05/23/2002
  • Status: Active Grant
First Claim
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1. A probe comprising:

  • (a) a dielectric substrate;

    (b) an elongate conductor suitable to be electrically interconnected to a test signal and contacting a first side of said substrate;

    (c) a conductive member suitable to be electrically interconnected to a ground signal and contacting a second side of said substrate wherein said conductive member is adjacent a majority of the length of said elongate conductor;

    (d) a conductive path between said first side of said substrate and said second side of said substrate and said conductive path free from electrical interconnection with said conductive member;

    (e) a contact electrically interconnected to said conductive path for testing a device under test; and

    (f) wherein said substrate has a thickness of less than 40 microns with a dielectric constant of less than 7.

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