Interferometer spectrometer with reduced alignment sensitivity

• US 7,161,679 B2
• Filed: 12/04/2002
• Issued: 01/09/2007
• Est. Priority Date: 10/08/1999
• Status: Expired due to Fees

• Current Assignee: Inlight Solutions Incorporated Merly Riogrande Technologies Incorporated
• Original Assignee: Inlight Solutions Incorporated Merly Riogrande Technologies Incorporated
• Inventors: Messerschmidt, Robert G., Abbink, Russell E.
• Primary Examiner(s): Turner; Samuel A.
• Assistant Examiner(s): CONNOLLY, PATRICK J
• Application Number:
  US10/309,994
• Publication Number:
  US 20030117629A1
• Time in Patent Office: 1,497 Days
• Field of Search: 356/455, 356/451, 356/456, 356/450
• US Class Current: 356/455
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes

Abstract

An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compensated interferometer designs, lateral separation errors in the output ray pair due to optical component misalignment are reduced. The reduced alignment sensitivity may be accomplished by utilizing simple planar components that are common to both light paths. The reduced alignment sensitivity and simplicity in design provides a more compact and more robust interferometer, with reduced manufacturing costs associated therewith. An elliptical field of view light source that utilizes an array of collimator lenses is also described. The light source provides a more compact design than a single circular collimator lens of the same area, and is suitable for single channel or multi-channel use.

Claims

1. A method of generating an optical interference pattern utilizing an interferometer having a plurality of optical components including a redirecting means and a beam splitter, the method comprising the steps of:

generating an input ray;

splitting the input ray into a first and a second ray with the beam splitter, both the first ray and the second ray optically interacting in parallel optical paths with all of the optical components of the interferometer;

redirecting the first ray and the second ray toward the beam splitter with the redirecting means;

creating an optical path length difference between the first and second rays; and

combining the first ray and the second ray to form an output ray pair having an interference pattern.

2. A method of creating an optical interference pattern utilizing an interferometer, the method comprising the steps of:

receiving an input ray;

splitting the input ray into a first ray and a second ray;

directing the first ray and the second ray to cause the rays to interact in parallel optical paths with a number of optical components included in the interferometer;

redirecting the first ray and the second ray to re-interact with at least one optical component;

creating an optical path length difference between the first and second rays; and

combining the first ray and the second ray to form an output ray pair having an interference pattern;

wherein the second ray interacts with every optical component with which the first ray interacts.

3. The method of claim 2, wherein the first ray interacts with every optical component with which the second ray interacts.

4. The method of claim 2, wherein at least one of the optical components is a flat mirror.

5. An interferometer spectrometer comprising:

a beam splitter for splitting an input ray into a first ray and a second ray having a first path and a second path, respectively;

redirecting means for redirecting the first and second rays in parallel optical paths back toward the beam splitter to combine the rays into an output ray pair;

a compensator for equalizing the optical path lengths of the first and second paths; and

a means for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, the path length difference generating means disposed in the first and second paths such that the first and second rays pass therethrough.

6. The interferometer of claim 5, wherein the redirecting means is a single flat mirror.

7. The interferometer of claim 5, wherein the redirecting means is a Porro prism.

8. The interferometer of claim 5, wherein the redirecting means is a V-mirror.

9. The interferometer of claim 5, wherein the redirecting means is a retroreflector.

10. The interferometer of claim 5, wherein:

the compensator is a compensator plate;

the compensator plate is placed such that the first ray traverses the compensator plate three times before reaching the redirecting means;

the beam splitter is a plate having a partially reflective coating on a first portion and a completely reflecting coating on a second portion;

the beam splitter is designed such that the second ray traverses the beam splitter twice after the input ray is split and before the second ray reaches redirecting means; and

the beam splitter and the compensator plate are of essentially the same thickness and have essentially the same refractive index.

11. The interferometer of claim 5, wherein the path length difference generating means includes a scanner plate placed such that both the first ray and the second ray pass through the scanner plate at approximately the same location.

12. The interferometer of claim 11, wherein the scanner plate is placed such that the first ray and the second ray are approximately orthogonal at the location of the scanner plate.

13. The interferometer of claim 5, wherein the redirecting means includes a first mirror and a second mirror, wherein the first ray and the second ray both interact with the first mirror and then the second mirror.

14. The interferometer of claim 13, wherein the path length difference generating means includes a scanner plate.

15. The interferometer of claim 14, wherein the scanner plate is placed such that the first ray passes through the scanner plate after interacting with the first mirror and before interacting with the second mirror, and the second ray passes through the scanner plate before interacting with either mirror.

16. The interferometer of claim 5, wherein the path length difference generating means includes a first element and a second element, wherein the first ray and the second ray both propagate from a surface of the first element in generally parallel paths, and wherein the first ray and the second ray both propagate from a surface of the second element in generally orthogonal paths.