Apparatus and method for compressing redundancy information for embedded memories, including cache memories, of integrated circuits

• US 7,162,669 B2
• Filed: 06/10/2003
• Issued: 01/09/2007
• Est. Priority Date: 06/10/2003
• Status: Expired due to Fees

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Inventors: Gross, Fred
• Primary Examiner(s): Decady; Albert
• Assistant Examiner(s): Trimmings; John P.
• Application Number:
  US10/458,474
• Publication Number:
  US 20040255209A1
• Time in Patent Office: 1,309 Days
• Field of Search: None
• US Class Current: 714/710
• CPC Class Codes: G11C 15/00 Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
• CPC Class Codes: G11C 29/4401 for self repair
• CPC Class Codes: G11C 29/76 using address translation or modifications

Abstract

An embedded memory on an integrated circuit has a memory cell array equipped with replacement cells and mapping logic for electronically substituting the replacement cells for defective cells at at least one location in the memory cell array. The memory also has programmable links for storing redundancy information in a compressed format, and decoding logic for decompressing the redundancy information and controlling the mapping logic.

Claims

1. An embedded memory having compressed redundancy information on an integrated circuit, comprising:

a memory cell array;

replacement cells;

mapping logic coupled to the memory cell array and the replacement cells for electronically substituting the replacement cells for defective cells at at least one location in the memory cell array;

programmable links for storing compressed redundancy information; and

decoding logic for decompressing the compressed redundancy information stored in the programmable links and for providing decompressed redundancy information for controlling the mapping logic;

wherein the embedded memory having compressed redundancy information is a memory of a cache memory subsystem of a processor integrated circuit selected from the group consisting of a tag memory and a data memory; and

wherein the compressed redundancy information is encoded according to the formula;

−

(red0*red0)/2+(2*io₁₃bits+3)*red0/2+red1−

red0

where;

red0 is a column at which a first replacement cell column is substituted into the array,

red1 is a column at which a second replacement cell column is substituted into the array; and

io_bits is the number of columns at which the first replacement cell column can be substituted into the memory.

2. The embedded memory of claim 1 having compressed redundancy information on an integrated circuit, wherein the integrated circuit comprises at least two memory cell arrays.

3. A processor integrated circuit comprising:

at least one processor;

at least one cache memory coupled to the at least one processor to provide instructions thereto, the cache memory comprising;

a cache tag memory,

address comparison logic for comparing a portion of address information with information from the cache tag memory,

hit-detection logic coupled to the address comparison logic for determining cache hits and

cache data memory for storing instructions to be provided to the processor;

wherein the cache data memory comprises;

a memory cell array,

replacement cells,

mapping logic for electronically substituting the replacement cells for defective cells at at least one location in the memory cell array;

programmable links for storing compressed redundancy information; and

apparatus for decoding compressed redundancy information stored in the programmable links and providing decompressed redundancy information to control the mapping logic; and

wherein the at least one cache memory also provides data to the at least one processor; and

wherein the apparatus for decoding compressed redundancy information decodes redundancy information encoded according to the equation;

−

(red0*red0)/2+(2io₁₃bits+3)*red0/2+red1−

red0

where;

red0 is a column at which a first replacement cell column is substituted into the array,

red1 is a column at which a second replacement cell column is substituted into the array; and

io_bits is the number of columns at which the first replacement cell column can be substituted into the memory.