Methods and apparatus for data analysis
First Claim
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1. A test system, comprising:
- a storage system configured to store test data for at least two datasets of test data for at least two sets of components, wherein a first component in a first dataset corresponds to a second component in a second dataset; and
a composite analysis element configured to analyze the test data for the corresponding first and second components for common characteristics, wherein the composite analysis element is configured to compare a summary value for the corresponding components to a dynamic threshold based on the test data.
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Abstract
A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
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Citations
47 Claims
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1. A test system, comprising:
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a storage system configured to store test data for at least two datasets of test data for at least two sets of components, wherein a first component in a first dataset corresponds to a second component in a second dataset; and a composite analysis element configured to analyze the test data for the corresponding first and second components for common characteristics, wherein the composite analysis element is configured to compare a summary value for the corresponding components to a dynamic threshold based on the test data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A test system, comprising:
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a tester configured to test at least two sets of components and generate at least two datasets of test data, wherein components from each set of components correspond to components in other sets of components, wherein the corresponding components occupy corresponding locations on different wafers; and a composite analysis element configured to analyze the test data for common characteristics among the corresponding components, wherein the composite analysis element is configured to compare a summary value for the corresponding components to a dynamic threshold based on the data. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
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32. A method for testing semiconductors, comprising:
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obtaining at least two datasets of test data for at least two sets of components, wherein a first component in a first set corresponds to a second component in a second set; and analyzing the test data for the corresponding first and second components for common characteristics, wherein analyzing the test data comprises comparing a summary value for the corresponding components to a dynamic threshold based on the data. - View Dependent Claims (33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47)
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Specification