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Digital measuring system and method for integrated circuit chip operating parameters

  • US 7,168,853 B2
  • Filed: 01/10/2003
  • Issued: 01/30/2007
  • Est. Priority Date: 01/10/2003
  • Status: Expired due to Fees
First Claim
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1. An integrated circuit chip comprising:

  • at least one measuring device for providing a digital value that corresponds to at least one of a plurality of physical operating parameters of said integrated chip, wherein said measuring device is contained within said integrated circuit chip;

    an on-chip monitoring system for self-monitoring measured operating parameters and generating control signals to execute functions in response to said measured operating parameters, wherein said on-chip monitoring system includes a general purpose register storing data of said digital value, a threshold register, and a reference register and upon receiving a set parameter instruction data is transferred from said general purpose register to one or both of said threshold register or said reference register, for use in producing a measurement value based on said digital value from said measuring device;

    at least one digital communication device through which said measurement value can be communicated to a plurality of other devices including a further device on said integrated circuit chip and including an internal bus connected to said general purpose register for communicating with said on-chip monitoring system,wherein said on-chip monitoring system further includes a serializer/deserializer connected to said internal bus and a multiplexer/demultiplexer connected between said serializer/deserializer and said threshold register for transferring data thereto; and

    an interrupt handler receiving a signal from said reference register for causing a transfer of data for said sensor register and said serializer/deserializer, and the internal bus from the general purpose register.

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