Method and system for wideband device measurement and modeling
First Claim
1. A method for wideband measurement of an electronic device, comprising the steps of:
- measurement of an electronic device to obtain a set of time domain raw data representing electrical characteristics of said device;
conversion of said time domain raw data into frequency domain raw data using a Fourier transform;
calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing electrical characteristics of said device;
conversion of said clean frequency domain data into clean time domain data; and
outputting said clean time domain data representing electrical characteristics of said device to an output means;
wherein said time domain raw data are obtained by applying to said device an ultra short impulse and measuring said impulse and its response from said device.
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Abstract
The method for wideband device measurement and modeling includes: measurement of an electronic device to obtain a set of time domain raw data representing characteristics of said device; conversion of said time domain raw data into frequency domain raw data; calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing characteristics of said device; conversion of said frequency domain data into time domain clean data; and establishment of equivalent model of said device according to said time domain data. The time domain raw data are obtained by applying to said device an ultra short impulse and measuring said impulse and its response from said device. Conversion between said time domain data and said frequency domain data may be Fourier transform.
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Citations
12 Claims
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1. A method for wideband measurement of an electronic device, comprising the steps of:
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measurement of an electronic device to obtain a set of time domain raw data representing electrical characteristics of said device; conversion of said time domain raw data into frequency domain raw data using a Fourier transform; calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing electrical characteristics of said device; conversion of said clean frequency domain data into clean time domain data; and outputting said clean time domain data representing electrical characteristics of said device to an output means; wherein said time domain raw data are obtained by applying to said device an ultra short impulse and measuring said impulse and its response from said device. - View Dependent Claims (2, 3, 4, 5)
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6. A method for modeling of an electronic device, comprising the steps of:
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measurement of an electronic device to obtain a set of time domain raw data representing electrical characteristics of said device; conversion of said time domain raw data into frequency domain raw data using a Fourier transform; calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing electrical characteristics of said device; conversion of said clean frequency domain data into clean time domain data; establishment of an equivalent model of said device according to said clean time domain data; and outputting the equivalent model of said device to an output means; wherein said time domain raw data are obtained by applying to said device an ultra short impulse and measuring said impulse and its response from said device. - View Dependent Claims (7, 8, 9, 10, 11, 12)
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Specification