System and method for the analysis of semiconductor test data
First Claim
1. A method of analyzing semiconductor test data, comprising:
- receiving a plurality of raw data entries from a testing system, each raw data entry associated with a test structure of a semiconductor device, each raw data entry uniquely identified by a name including a plurality of parseable fields;
parsing the plurality of data entries using a selected one of the plurality of parseable fields to identify a grouping of raw data entries;
calculating at least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries;
providing the at least one reportable parameter to user; and
comparing the at least one reportable parameter to a set of limits to determine whether the at least one reportable parameter is within the set of limits; and
disregarding the raw data entries if the at least one reportable parameter is not within the set of limits.
1 Assignment
0 Petitions
Accused Products
Abstract
According to one embodiment, a method of analyzing semiconductor test data includes receiving a plurality of raw data entries from a testing system. Each raw data entry is associated with a test structure of a semiconductor device, and each raw data entry is uniquely identified by a name including a plurality of parseable fields. The plurality of data entries is parsed using a selected one of the plurality of parseable fields to identify a grouping of raw data entries. At least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries is calculated, and the at least one reportable parameter is provided to a user.
20 Citations
17 Claims
-
1. A method of analyzing semiconductor test data, comprising:
-
receiving a plurality of raw data entries from a testing system, each raw data entry associated with a test structure of a semiconductor device, each raw data entry uniquely identified by a name including a plurality of parseable fields; parsing the plurality of data entries using a selected one of the plurality of parseable fields to identify a grouping of raw data entries; calculating at least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries; providing the at least one reportable parameter to user; and comparing the at least one reportable parameter to a set of limits to determine whether the at least one reportable parameter is within the set of limits; and disregarding the raw data entries if the at least one reportable parameter is not within the set of limits. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. A system for analyzing semiconductor test data, comprising:
-
a database storing a plurality of raw data entries from a testing system, each raw data entry associated with a test structure of a semiconductor device, each raw data entry uniquely identified by a name including a plurality of parseable fields; a parser operable to; parse the plurality of data entries using a selected one of the plurality of parseable fields to identify a grouping of raw data entries; calculate at least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries; a manager operable to provide the at least one reportable parameter to a user; and wherein the parser is further operable to; compare the at least one reportable parameter to a set of limits to determine whether the at least one reportable parameter is within the set of limits; and disregard the raw data entries if the at least one reportable parameter is not within the set of limits. - View Dependent Claims (12, 13, 14, 15, 16, 17)
-
Specification