Lithographic apparatus, device manufacturing method, and device manufactured thereby
First Claim
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1. A lithographic projection apparatus comprising:
- a programmable patterning structure configured to pattern a pulsed beam of radiation according to a desired pattern;
a projection system configured to project the patterned radiation beam onto a target portion of a substrate;
a positioning structure configured to move the substrate relative to the projection system during exposure by the patterned radiation beam;
an optical structure configured to move the patterned radiation beam relative to the projection system during at least one pulse of the radiation beam; and
a control system configured to rotate the optical structure according to a rotation timing that corresponds to a pulse frequency of the radiation beam,wherein the lithographic projection apparatus is configured to scan the patterned radiation beam in synchronism with movement of the substrate during the at least one pulse.
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Abstract
Apparatus and methods for compensating for the movement of a substrate in a lithographic apparatus during a pulse of radiation include providing an optical structure configured to move a patterned projection beam incident on the substrate in synchronism with the substrate.
14 Citations
21 Claims
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1. A lithographic projection apparatus comprising:
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a programmable patterning structure configured to pattern a pulsed beam of radiation according to a desired pattern; a projection system configured to project the patterned radiation beam onto a target portion of a substrate; a positioning structure configured to move the substrate relative to the projection system during exposure by the patterned radiation beam; an optical structure configured to move the patterned radiation beam relative to the projection system during at least one pulse of the radiation beam; and a control system configured to rotate the optical structure according to a rotation timing that corresponds to a pulse frequency of the radiation beam, wherein the lithographic projection apparatus is configured to scan the patterned radiation beam in synchronism with movement of the substrate during the at least one pulse. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A device manufacturing method, comprising:
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providing a pulsed beam of radiation; patterning the pulsed beam according to a desired pattern; projecting the patterned radiation beam onto a target portion of a layer of radiation-sensitive material that at least partially covers a substrate; moving the substrate relative to a projection system that projects the patterned radiation beam onto the substrate during exposure; and altering a path of the patterned radiation beam relative to the projection system during at least one pulse of the radiation beam, wherein the path is altered in synchronism with the movement of the substrate during the at least one pulse and wherein a cross-section of the patterned radiation beam is projected onto a plane substantially parallel to a surface of the target portion of the substrate. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A device manufacturing method, comprising:
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providing a pulsed beam of radiation; patterning the pulsed beam according to a desired pattern; projecting the patterned radiation beam onto a target portion of a layer of radiation-sensitive material that at least partially covers a substrate; moving the substrate relative to a projection system that projects the patterned radiation beam onto the substrate during exposure; using an optical structure to move the patterned radiation beam relative to the projection system during at least one pulse of the radiation beam; and rotating the optical structure according to a rotation timing that corresponds to a pulse frequency of the radiation beam, wherein the patterned radiation beam is scanned in synchronism with the movement of the substrate during the at least one pulse.
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Specification