Lithographic apparatus and device manufacturing method
First Claim
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1. A lithographic apparatus comprising:
- an illumination system that conditions a beam of radiation;
an array of individually controllable elements that pattern the beam;
a beam divider that divides an intensity of the patterned beam into at least first and second fractions, each having substantially a complete cross-section of the pattern;
a projection system that projects the first fraction of the patterned beam onto a target portion of a substrate; and
an image sensor that inspects at least a portion of the cross-section of the second fraction of the patterned beam,wherein the beam divider is positioned between a last element of the proiection system and the substrate.
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Abstract
Lithographic apparatus using an array of individually controllable elements in which a fraction of the intensity of the beam of radiation patterned by the array of individually controllable elements is diverted to an image sensor for verifying the quality of the image generated.
60 Citations
27 Claims
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1. A lithographic apparatus comprising:
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an illumination system that conditions a beam of radiation; an array of individually controllable elements that pattern the beam; a beam divider that divides an intensity of the patterned beam into at least first and second fractions, each having substantially a complete cross-section of the pattern; a projection system that projects the first fraction of the patterned beam onto a target portion of a substrate; and an image sensor that inspects at least a portion of the cross-section of the second fraction of the patterned beam, wherein the beam divider is positioned between a last element of the proiection system and the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A device manufacturing method, comprising:
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patterning a beam of radiation using array of individually controllable elements; dividing an intensity of the patterned beam into at least first and second fractions, each of the first and second fractions having substantially a complete cross-section of the pattern; projecting the first fraction of the patterned beam onto a target portion of a substrate; polarization filtering the second fraction of the patterned beam; and inspecting at least a portion of the cross-section of the second fraction of the patterned beam that is plane polarized in a given orientation with an image sensor.
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26. A lithographic apparatus, comprising:
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an illumination system that conditions a beam of radiation; an array of individually controllable elements that pattern the beam; a beam divider that divides an intensity of the patterned beam into at least first and second portions, each of the first and second portions having substantially a complete cross-section of the pattern; a projection system that projects the first portion of the patterned beam onto a target portion of a substrate; and an image sensor that inspects at least a part of the cross-section of the second portion of the patterned beam, the image sensor including a number of sensing pixels that is greater than a number of individually controllable elements in the array of individually controllable elements, whereby through the greater number of sensing pixels than the individually controllable elements the image sensor is configured, to have increased sensitivity to detect minor variations from an intended image. - View Dependent Claims (27)
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Specification